1. Tolerating Defects in Low-Power Neural Network Accelerators Via Retraining-Free Weight Approximation.
- Author
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HOSSEINI, FATEME S., FANRUO MENG, CHENGMO YANG, WUJIE WEN, and CAMMAROTA, ROSARIO
- Subjects
MEMORY ,OCCUPATIONAL retraining ,ALGORITHMS - Abstract
Hardware accelerators are essential to the accommodation of ever-increasing Deep Neural Network (DNN) workloads on the resource-constrained embedded devices. While accelerators facilitate fast and energyefficient DNN operations, their accuracy is threatened by faults in their on-chip and off-chip memories, where millions of DNN weights are held. The use of emerging Non-Volatile Memories (NVM) further exposes DNN accelerators to a non-negligible rate of permanent defects due to immature fabrication, limited endurance, and aging. To tolerate defects in NVM-based DNN accelerators, previous work either requires extra redundancy in hardware or performs defect-aware retraining, imposing significant overhead. In comparison, this paper proposes a set of algorithms that exploit the flexibility in setting the fault-free bits in weight memory to effectively approximate weight values, so as to mitigate defect-induced accuracy drop. These algorithms can be applied as a one-step solution when loading the weights to embedded devices. They only require trivial hardware support and impose negligible run-time overhead. Experiments on popular DNN models show that the proposed techniques successfully boost inference accuracy even in the face of elevated defect rates in the weight memory. [ABSTRACT FROM AUTHOR]
- Published
- 2021
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