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Start Over Author "M.F. Murfitt" Publisher crc press
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1. Aberration Correction in Electron Microscopy

Author

Niklas Dellby, M.F. Murfitt, and Ondrej L. Krivanek

Subjects
Nuclear magnetic resonance, Materials science, Contrast transfer function, law, Scanning confocal electron microscopy, Electron microscope, law.invention
Published
2017
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