1. XFEL: The European X-Ray Free-Electron Laser - Technical Design Report
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Abela, R., Aghababyan, A., Altarelli, M., Altucci, C., Amatuni, G., Anfinrud, P., Audebert, P., Ayvazyan, V., Baboi, N., Baehr, J., Balandin, V., Bandelmann, R., Becker, J., Beutner, B., Blome, C., Bohnet, I., Bolzmann, A., Bostedt, C., Bozhko, Y., Brandt, A., Bratos, S., Bressler, C., Brovko, O., Brück, H., Carneiro, J.-P., Casalbuoni, S., Castellano, M., Castro, P., Catani, L., Cavalleri, A., Celik, S., Chapman, H., Charalambidis, D., Chen, J., Chergui, M., Choroba, S., Cianchi, A., Clausen, M., Collet, E., Danared, H., David, C., Decking, W., Dehler, M., Delsim-Hashemi, H., Dipirro, G., Dobson, B., Dohlus, M., Duesterer, S., Eckhardt, A., Eckoldt, H.-J., Edwards, H., Faatz, B., Fajardo, M., Fateev, A., Feldhaus, J., Filipov, Y., Floettmann, K., Follath, R., Fominykh, B., French, M., Frisch, J., Froehlich, L., Gadwinkel, E., García-Tabarés, L., Gareta, J. J., Garvey, T., Gel'mukhanov, F., Gensch, U., Gerth, C., Goerler, M., Golubeva, N., Graafsma, H., Graeff, W., Grimm, O., Griogoryan, B., Grübel, G., Gutt, C., Hacker, K., Haenisch, L., Hahn, U., Hajdu, J., Han, J. H., Hartrott, M., Havlicek, J., Hensler, O., Honkavaara, K., Honkimäki, V., Hott, T., Howells, M. R., Huening, M., Ihee, H., Ilday, F. Ö., Ischebeck, R., Jablonka, M., Jaeschke, E., Jensch, K., Jensen, J.-P., Johnson, S., Juha, L., Kaerntner, F., Kammering, R., Kapitza, H., Katalev, V., Keil, B., Khodyachykh, S., Kienberger, R., Kim, J.-W., Kim, Y., Klose, K., Kocharyan, V., Koehler, W., Koerfer, M., Kollewe, M., Kong, Q., Kook, W., Kostin, D., Kozlov, O., Kraemer, D., Krasilnikov, M., Krause, B., Krebs, O., Krzywinski, J., Kube, G., Kuhlmann, M., Laich, H., Lange, R., Larsson, M., Lee, R. W., Leuschner, A., Lierl, H., Lilje, L., Limberg, T., Lindenberg, A., Lipka, D., Loehl, F., Ludwig, K., Luong, M., Magne, C., Maquet, A., Marangos, J., Masciovecchio, C., Maslov, M., Matheisen, A., Matyushevskiy, E., Matzen, O., May, H.-J., McNulty, I., McCormick, D., Meulen, P., Meyners, N., Michelato, P., Mildner, N., Miltchev, V., Minty, M., Moeller, W.-D., Möller, T., Monaco, L., Nagl, M., Napoly, O., Neubauer, G., Nicolosi, P., Nienhaus, A., Noelle, D., Nunez, T., Obier, F., Oppelt, A., Pagani, C., Paparella, R., Pedersen, H. B., Petersen, B., Petrosyan, B., Petrosyan, L., Petrov, A., Pflueger, J., Piot, P., Plech, A., Ploenjes, E., Poletto, L., Pöplau, G., Prat, E., Prat, S., Prenting, J., Proch, D., Pugachov, D., Quack, H., Racky, B., Ramert, D., Redlin, H., Rehlich, K., Reininger, R., Remde, H., Reschke, D., Richter, D., Richter, M., Riemann, S., Riley, D., Robinson, I., Roensch, J., Rosmej, F., Ross, M., Rossbach, J., Rybnikov, V., Sachwitz, M., Saldin, E., Sandner, W., Schäfer, J., Schilcher, T., Schlarb, H., Schloesser, M., Schlott, V., Schmidt, B., Schmitz, M., Schmueser, P., Schneider, J., Schneidmiller, E., Schotte, F., Schrader, S., Schreiber, S., Schroer, C., Schuch, R., Schulte-Schrepping, H., Schwarz, A., Seidel, M., Sekutowicz, J., Seller, P., Sellmann, D., Senf, F., Sertore, D., Shabunov, A., Simrock, S., Singer, W., Sinn, H., Smith, R., Sombrowski, E., Sorokin, A. A., Springate, E., Staack, M., Staykov, L., Steffen, B., Stephenson, B., Stephan, F., Stulle, F., Syresin, E., Sytchev, K., Sytchev, V., Tallents, G., Techert, S., Tesch, N., Thom, H., Tiedtke, K., Tischer, M., Tolan, M., Toleikis, S., Toral, F., Treusch, R., Trines, D., Tsakanov, V., Tsakov, I., Tschentscher, T., Ullrich, F.-R., van Rienen, U., Variola, A., Vartaniants, I., Vogel, E., Vogel, J., Vuilleumier, R., Wabnitz, H., Wanzenberg, R., Wark, J. S., Weddig, H., Weiland, T., Weise, H., Wendt, M., Wenndorff, R., Wichmann, R., Will, I., Winter, A., Witte, K., Wittenburg, K., Wochner, P., Wohlenberg, T., Wojtkiewicz, J., Wolf, A., Wulff, M., Yurkov, M., Zagorodnov, I., Zambolin, P., Zapfe, K., Zeitoun, P., Ziemann, V., Zolotov, A., Brinkmann, R., and Grabosch, H.-J.
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Physics - Abstract
This report contains a comprehensive technical description of a new international research infrastructure, the European X-Ray Free-Electron Laser (XFEL) Facility. It was written between October 2005 and June 2006 and provides a realistic cost estimate and a compelling assessment of the scientific pay-off. The report has been prepared with the contribution of hundreds of people from many laboratories in Europe and even beyond. Their contributions have been harmonised and merged by many editors, and the whole effort has been coordinated by the European Project Team, generously supported and hosted by the Deutsches Elektronen-Synchrotron (DESY) laboratory.
- Published
- 2006
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