1. Suppression of the vacuum space-charge effect in fs-photoemission by a retarding electrostatic front lens
- Author
-
Siarhei Dziarzhytski, Steffen Palutke, Michael Heber, Kai Rossnagel, Thomas K. Allison, Katerina Medjanik, S. Babenkov, Yu. Matveyev, Laurenz Rettig, V. Shokeen, Bastian Manschwetus, Ingmar Hartl, S. K. Mahatha, D. Vasilyev, Nora Schirmel, Martin Beye, Gerd Schönhense, Frederico Pressacco, Harald Redlin, Steinn Ymir Agustsson, G. Brenner, O. Fedchenko, B. Schönhense, Hans-Joachim Elmers, Lukas Wenthaus, D. Kutnyakhov, Andrei Gloskovskii, N. Wind, H. Duerr, Christoph Schlueter, and S. Chernov
- Subjects
010302 applied physics ,Photon ,Materials science ,Electron ,Photoelectric effect ,01 natural sciences ,Fluence ,Space charge ,010305 fluids & plasmas ,Electric field ,Extreme ultraviolet ,0103 physical sciences ,ddc:620 ,Atomic physics ,Instrumentation ,Storage ring - Abstract
Review of scientific instruments 92(5), 053703 (2021). doi:10.1063/5.0046567, The performance of time-resolved photoemission experiments at fs-pulsed photon sources is ultimately limited by the e–e Coulomb interaction, downgrading energy and momentum resolution. Here, we present an approach to effectively suppress space-charge artifacts in momentum microscopes and photoemission microscopes. A retarding electrostatic field generated by a special objective lens repels slow electrons, retaining the k-image of the fast photoelectrons. The suppression of space-charge effects scales with the ratio of the photoelectron velocities of fast and slow electrons. Fields in the range from −20 to −1100 V/mm for E$_{kin}$ = 100 eV to 4 keV direct secondaries and pump-induced slow electrons back to the sample surface. Ray tracing simulations reveal that this happens within the first 40 to 3 μm above the sample surface for E$_{kin}$ = 100 eV to 4 keV. An optimized front-lens design allows switching between the conventional accelerating and the new retarding mode. Time-resolved experiments at E$_{kin}$ = 107 eV using fs extreme ultraviolet probe pulses from the free-electron laser FLASH reveal that the width of the Fermi edge increases by just 30 meV at an incident pump fluence of 22 mJ/cm$^2$ (retarding field −21 V/mm). For an accelerating field of +2 kV/mm and a pump fluence of only 5 mJ/cm$^2$, it increases by 0.5 eV (pump wavelength 1030 nm). At the given conditions, the suppression mode permits increasing the slow-electron yield by three to four orders of magnitude. The feasibility of the method at high energies is demonstrated without a pump beam at E$_{kin}$ = 3830 eV using hard x rays from the storage ring PETRA III. The approach opens up a previously inaccessible regime of pump fluences for photoemission experiments., Published by American Institute of Physics, [S.l.]
- Published
- 2021
- Full Text
- View/download PDF