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We have combined recent experimental developments in our laboratory with modelling to devise ways of maximising the stabilised efficiency of hydrogenated amorphous silicon (a-Si:H) PIN solar cells. The cells were fabricated using the conventional plasma enhanced chemical vapour deposition (PECVD) technique at various temperatures, pressures and gas flow ratios. A detailed electrical-optical simulator was used to examine the effect of using wide band gap P-and N-doped μc-SiOx:H layers, as well as a MgF2 anti-reflection coating (ARC) on cell performance. We find that with the best quality a-Si:H so far produced in our laboratory and optimised deposition parameters for the corresponding solar cell, we could not attain a 10% stabilised efficiency due to the high stabilised defect density of a-Si:H, although this landmark has been achieved in some laboratories. On the other hand, a close cousin of a-Si:H, hydrogenated polymorphous silicon (pm-Si:H), a nano-structured silicon thin film produced by PECVD under conditions close to powder formation, has been developed in our laboratory. This material has been shown to have a lower initial and stabilised defect density as well as higher hole mobility than a-Si:H. Modelling indicates that it is possible to attain stabilised efficiencies of 12% when pm-Si:H is incorporated in a solar cell, deposited in a NIP configuration to reduce the P/I interface defects and combined with P- and N-doped μc-SiOx:H layers and a MgF2 ARC.

Photoluminescence measurements on solar cells are usually carried out under open-circuit conditions. We report here on an innovative approach, in which the samples are simultaneously illuminated and DC-biased, so that the luminescence can be monitored under several operating points, that is to say several injection levels, ranging from short-circuit conditions to the light-emitting regime of the device. The experiments were performed on in-house made c-Si/a-Si:H heterojunction solar cells illuminated by a continuous green laser diode and positively biased. The luminescence spectra obtained this way were compared to those obtained with no light excitation source, which corresponds to usual electroluminescence mode and dark J(V). Firstly, the obtained luminescence spectra have shown the expected exponential dependence on the applied voltage. Furthermore, given that the amplitude of the emitted luminescence is proportional to the radiative recombination rate, this approach enables to indirectly characterise the non-radiative recombination phenomena. In the case of HJ solar cells with intrinsic thin layers processed on high quality FZ-wafers, non-radiative recombination is dominated by the defects at the c-Si/a-Si:H interface. The luminescence measurements presented here therefore give information on the quality of the surface passivation. An estimation of the interface defect density was achieved by comparing our experimental results with modelling.