1. High-resolution calibrated successive-approximation-register analog-to-digital converter.
- Author
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Cao, Chao and Guo, Haijun
- Subjects
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ANALOG-to-digital converters , *SUCCESSIVE approximation analog-to-digital converters , *COMPLEMENTARY metal oxide semiconductors , *CAPACITORS , *COMPARATOR circuits , *ELECTRIC capacity - Abstract
This paper presents a 16-bit 1-Msps successive-approximation-register analog-to-digital converter (ADC) with a split-ADC digital calibration scheme based on dynamic element matching. A multi-segment capacitor array with redundant bits is utilised for ensuring that missing-level errors are calibrated in the digital domain, reducing the area and power consumption. The key circuit modules are optimised, such as the low-power dual-mode cascade comparator and dynamic element matching control logic. The prototype is fabricated by a 0.18-μm CMOS technology, and it exhibits 170.47 dB figure of merit Schreier (FoMs), 15.04 bits effective number of bits (ENOB) and 119.50 dB spurs free dynamic range (SFDR). The peak differential nonlinearity (DNL) and integral nonlinearity (INL) are −0.422/0.536 LSB and −0.721/0.758 LSB, respectively. • A 16-bit 1 Msps SAR ADC is manufactured in 0.18 μm CMOS process with 170.47 dB FoMs. • A split-ADC digital calibration scheme based on dynamic element matching can improve the SFDR effectively. • A segmented capacitor array of 4 sub-capacitor arrays decreases the total capacitance of the high-resolution SAR ADC. • A dual-mode automatic zero comparator is utilised to reduce power consumption. [ABSTRACT FROM AUTHOR]
- Published
- 2022
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