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Highlights • GaN-based THz-QCL active region was grown by MOCVD on Si substrate. • A GaN/AlGaN QC active layer consisting of two-QW for one-period was grown. • Samples were evaluated by HR-XRD and cross-sectional TEM. • FWHM of the XRD satellite peaks became narrower when growth temperature decreased. Abstract GaN/AlGaN THz quantum-cascade laser (QCL) structures were grown on AlGaN/Si templates by a metal-organic chemical vapor deposition (MOCVD). We aim to fabricate a double metal waveguide (DMW) based GaN THz QCL through removing the Si substrate by wet etching. The DMW is essential for realizing low cavity loss and a very high optical confinement factor (99%). We grew 100 periods of GaN/Al 0.21 Ga 0.79 N two quantum wells (QW) type active region on Al 0.08 Ga 0.92 N/Si templates. Samples were evaluated by cross-sectional transmission-electron microscopy (TEM) and high-resolution X-ray diffraction (HR-XRD). We found that the full width at half maximum (FWHM) of the XRD satellite peaks became narrower when the growth temperature decreased, and the steepness of the QC layer hetero-interfaces has been improved. [ABSTRACT FROM AUTHOR]

Nonradiative recombination (NRR) processes through defect states and their temperature dependence in UV-B AlGaN MQW sample on sapphire substrate grown by MOCVD technique have been studied by photoluminescence (PL) spectroscopy. We detected NRR centers by adding a below-gap excitation light with photon energies from 0.93 eV to 1.46 eV on an above-gap excitation light of 4.66 eV. All the BGE energies decreased PL intensity at 25 K, and the most-distinct quenching is observed by 1.27 eV BGE at the same BGE photon number density. The temperature-dependent PL intensity for the BGE energy of 1.27 eV is interpreted by three NRR centers. The one-level model dominates over that of two-level model in the temperature range 58 K < T < 88 K. The two-level model prevails in other region of temperature. The combination of one-level and two-level models is consistent with the spectral peak-energy shift as a function of temperature. • Investigates NRR processes in UV-B AlGaN MQW by adding below-gap excitation light. • Detects NRR centers by observing PL-intensity change due to below-gap excitation. • Identifies correlation of T -dependent NRR processes with T -dependent PL peak-energy. • Interpret T -dependent NRR processes by a model based on SRH statistics. [ABSTRACT FROM AUTHOR]