12 results on '"Balboni, R"'
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2. Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon
3. Strain field reconstruction in shallow trench isolation structures by CBED and LACBED
4. Wavy growth onset in strain-balanced InGaAs multi-quantum wells
5. Techniques for mechanical strain analysis in sub-micrometer structures: TEM/CBED, micro-Raman spectroscopy, X-ray micro-diffraction and modeling
6. Strain induced by Ti salicidation in sub-quarter-micron CMOS devices, as measured by TEM/CBED
7. The problem of convolution in the simulation of multicrystal X-ray rocking curves of semiconductor materials
8. Recrystallization of strained [formula omitted] layers with various Ge gradients and in the presence of impurities
9. Evidence for molecular hydrogen in single crystal silicon
10. On the assessment of local stress distributions in integrated circuits
11. EPR and X-ray diffraction study of damage produced by implantation of B ions (50 keV, 1 MeV) or Si ions (50 keV, 700 keV, 1.5 MeV) into silicon
12. Giant radiation damage produced by the impact of heavy molecular ions onto silicon single crystal
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