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Understanding the effect of grain size on the overall electrical and thermal transport properties of PRGO films on a large scale is not only fundamental but also technologically important in order to tune their properties for wide applications. In this work, by adjusting the annealing temperature, we control the density of the oxygen containing functional groups and thus the structural domain size of PRGO film. The annealing effect on the temperature dependency of thermal and electrical transport is studied. In addition, the linear relationship between thermal diffusivity and electrical conductivity is confirmed from 320 K to 10 K. The temperature dependent thermal diffusivity of the amorphous region in PRGO is reported. In the last, based on the residual thermal reffusivity at 0 K limit, the structure defects induced phonon mean free path against the annealing temperature is obtained, and compared with the cluster size calculated from XRD, TEM and Raman. A linear relationship among the structure domain size, thermal diffusivity, and electrical conductivity is further revealed, which demonstrates the strong effect of structure domain size on the thermal and electrical transport of PRGO. [Display omitted] • A linear relationship between the thermal diffusivity and electrical conductivity from 320 K to 10 K is reported in PRGO films with varying reduction level. The corresponding mathematical model is proposed. • The electrical transport is found to vary with the thermal reduction level, where the temperature coefficient of resistance (TCR) decreases as the annealing temperature increases, reflecting a tunable band gap. • Based on the residual thermal reffusivity at 0 K limit, the structure defects induced phonon mean free path against the annealing temperature is obtained, and compared with the cluster size calculated from XRD and Raman. • A linear relationship among the structure domain size, thermal diffusivity, and electrical conductivity is further revealed. [ABSTRACT FROM AUTHOR]

Abstract Research has consistently linked homophobic bullying (e.g., teasing, name-calling, use of slurs) with an array of negative outcomes for children and adolescents. While most of the extant research covers risk factors related to homophobic bullying perpetration and victimization, there is a budding literature surrounding protective factors of these behaviors and their associated consequences. This article reviews 32 studies that focused on protective factors associated with homophobic bullying perpetration and victimization among children and adolescents. The review examines homophobic bullying as it applies to lesbian, gay, bisexual, transgender, and questioning (LGBTQ) youth and their heterosexual and cisgender peers. Using the social-ecological framework, this paper highlights protections at the individual level (e.g., sexual identity, self-esteem), the family level (e.g., social support at home), the peer level (e.g., positive friendships) and the school level (e.g., school policies against homophobic bullying, positive school climate). With the aim of contributing to the development of the field, directions for future research are also discussed. Highlights • Homophobic bullying is common among youth and has negative consequences for the targets. • Most of the literature on homophobic bullying has focused on risk factors. • Thirty-two articles were reviewed here that focused on protective factors associated with homophobic bullying among youth. • Youth who experience homophobic bullying have fewer negative outcomes if they have supportive friends and family. • Strong, positive, school climates can deter this homophobic bullying and/or ameliorate harmful consequences to targets. [ABSTRACT FROM AUTHOR]