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Your search keyword '"Karamimanesh, Mehrzad"' showing total 4 results

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1. A write bit-line free sub-threshold SRAM cell with fully half-select free feature and high reliability for ultra-low power applications.

2. A write bit-line free sub-threshold SRAM cell with fully half-select free feature and high reliability for ultra-low power applications.

3. A robust and write bit-line free sub-threshold 12T-SRAM for ultra low power applications in 14 nm FinFET technology.

4. Energy efficient approximate multipliers compatible with error-tolerant application.

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