5 results on '"Rzepa, G."'
Search Results
2. Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence.
3. Comphy — A compact-physics framework for unified modeling of BTI.
4. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability.
5. The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.