1. Retrieving images from tarnished daguerreotypes using X-ray fluorescence imaging with an X-ray micro beam with tunable energy.
- Author
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Sham, Tsun-Kong, Finfrock, Y. Zou, Xiao, Qunfeng, Feng, Renfei, and Bassnett, Sarah
- Subjects
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X-ray fluorescence , *X-ray imaging , *FLUORESCENCE yield , *RADIATION damage , *EXERCISE tolerance , *SURFACE analysis - Abstract
• Delicate images can be retrieved from tarnished daguerreotypes by tracking the Hg Lα XRF excited with a focused synchrotron X-ray beam at energy just above the Hg L3 -edge if the bulk of the image particles remains intact. Surface corrosion is not an issue. • While the risk of radiation damage is low, ultra bright X-ray can produce radiation damage in scattered spots, an upper bound of flux tolerance has been established. • Image can also be retrieved with tender X-rays (2.5–7 keV) using Ag L α and Hg Mα XRF; the shallow penetration depth of tender X-rays minimizes background. • Tender X-ray imaging in a high vacuum provides the added advantage of measuring the surface sensitive total electron yield and the bulk sensitive fluorescence yield, which in turn can be used for micro-spectroscopy and surface corrosion analysis. We report recent observations using a synchrotron X-ray micro-beam to retrieve images from tarnished 19th century daguerreotypes. We confirm that high quality image can always be retrieved from tarnished plates using Hg L α XRF as long as the bulk of the image particles and their distribution remains intact. We also report results from using tunable tender X-rays (2 - 7 keV) to conduct imaging in high vacuum at energy above the Ag L-edge and the Hg M-edge, extracting images using Ag L α and Hg M α , respectively among others (e.g., S to track corrosion). Images obtained with the surface sensitive total electron yield (TEY) and the bulk sensitive fluorescence yield (FLY) as well as corresponding micro-XANES are reported. Flux tolerance to high intensity X-beam is also explored. These results and their implications for cultural heritage research are discussed. [ABSTRACT FROM AUTHOR]
- Published
- 2024
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