46 results on '"Baumbach, T."'
Search Results
2. Optimizing structural and mechanical properties of cryogel scaffolds for use in prostate cancer cell culturing
3. Hard X-ray index of refraction tomography of a whole rabbit knee joint: A feasibility study
4. Broadband X-ray edge-enhancement imaging of a boron fibre on lithium fluoride thin film detector
5. Angle-resolved X-ray reflectivity measurements during off-normal sputter deposition of VN
6. Growth and structure characterization of EuSi 2 films and nanoislands on vicinal Si(001) surface
7. Growth and doping of semipolar GaN grown on patterned sapphire substrates
8. Temperature dependent epitaxial growth regimes of europium on the oxygen-induced c(6×2) reconstructed (110)Nb surface
9. Investigation of the luminescence, crystallographic and spatial resolution properties of LSO:Tb scintillating layers used for X-ray imaging applications
10. Influence of a low-temperature capping on the crystalline structure and morphology of InGaN quantum dot structures
11. In-line X-ray lensless imaging with lithium fluoride film detectors
12. Optical characterisation of lithium fluoride detectors for broadband X-ray imaging
13. High resolution synchrotron X-ray studies of phase separation phenomena and the scaling law for the threading dislocation densities reduction in high quality AlGaN heterostructure
14. Particle and liquid motion in semi-solid aluminium alloys: A quantitative in situ microradioscopy study
15. A comparison of multi-scale 3D X-ray tomographic inspection techniques for assessing carbon fibre composite impact damage
16. Quantitative coalescence measurements for foaming metals by in situ radiography
17. Superhard nanocrystalline Ti–Cu–N coatings deposited by vacuum arc evaporation of a sintered cathode
18. X-ray study of surface layers of air-annealed Be12Ti and Be12V samples using synchrotron radiation
19. Investigation of buried quantum dots using grazing incidence X-ray diffraction
20. A novel undulator concept for electron beams with a large energy spread
21. Three-dimensional investigation of thermal barrier coatings by synchrotron-radiation computed laminography
22. A Superconducting Switch for Insertion Devices with Variable Period Length
23. Ductile crack initiation and propagation assessed via in situ synchrotron radiation-computed laminography
24. Neutron laminography—a novel approach to three-dimensional imaging of flat objects with neutrons
25. X-ray phase-contrast radiography using a filtered white beam with a grating interferometer
26. LPE grown LSO:Tb scintillator films for high-resolution X-ray imaging applications at synchrotron light sources
27. Characterisation of LSO:Tb scintillator films for high resolution X-ray imaging applications
28. Preliminary characterisation of CdTe M–π–n diode structures
29. Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
30. Dislocation generation related to micro-cracks in Si wafers: High temperature in situ study with white beam X-ray topography
31. In situ synchrotron computed laminography of damage in carbon fibre–epoxy [90/0]s laminates
32. The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source
33. White beam synchrotron topography using a high resolution digital X-ray imaging detector
34. Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging
35. Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging
36. ‘In-situ’ observation of dynamical diffraction by means of Medipix2 sensor crystal fulfilling Bragg condition
37. The determination of material parameters of microcomponents using digital holography
38. Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography
39. Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
40. μm-resolved high resolution X-ray diffraction imaging for semiconductor quality control
41. Shift detection by restoration
42. Non-uniform strain in epitaxial surface gratings: Beyond the ordinary elastic description
43. X-ray reflectivity investigation of thin p-type porous silicon layers
44. Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction
45. X-ray diffraction investigation of porous silicon superlattices
46. In-line X-ray lensless imaging with lithium fluoride film detectors
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