19 results on '"Haendler, S."'
Search Results
2. Intrinsic ESD robustness on new high voltage N/PMOS devices in 28 nm FDSOI UTBB CMOS technology through TLP/VFTLP characterizations
3. Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs
4. Hot-carrier degradation model for nanoscale ultra-thin body ultra-thin box SOI MOSFETs suitable for circuit simulators
5. Characterization and modeling of drain current local variability in 28 and 14 nm FDSOI nMOSFETs
6. Low frequency noise variability in ultra scaled FD-SOI n-MOSFETs: Dependence on gate bias, frequency and temperature
7. Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction
8. Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications
9. Evolution of low frequency noise and noise variability through CMOS bulk technology nodes from 0.5μm down to 20nm
10. Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology
11. Unexpected impact of germanium content in SiGe bulk PMOSFETs
12. Characterization and modeling of low frequency noise in CMOS inverters
13. Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs
14. Impact of a 10nm ultra-thin BOX (UTBOX) and ground plane on FDSOI devices for 32nm node and below
15. FDSOI devices with thin BOX and ground plane integration for 32nm node and below
16. Shrinking from 0.25 down to 0.12 μm SOI CMOS technology node: a contribution to low-frequency noise in partially depleted N-MOSFETs
17. Impact of front oxide quality on transient effects and low-frequency noise in partially and fully depleted SOI N-MOSFETs
18. Reliability of ultra-thin film deep submicron SIMOX nMOSFETs
19. Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.