17 results on '"Petrik, Peter"'
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2. In-situ spectral reflectance investigation of hetero-epitaxially grown β-Ga2O3 thin films on c-plane Al2O3 via MOVPE process
3. Photoinduced structural transformations of Au-As2S3 nanocomposite impregnated in silica porous glass matrix
4. In - Situ Spectral Reflectance Investigation of Heteroepitaxial Grown Β-Ga2o3thin Films on C-Plane Al2o3 Via Movpe Process
5. Silicon nanoparticles in higher plants: Uptake, action, stress tolerance, and crosstalk with phytohormones, antioxidants, and other signalling molecules
6. Species-specific growth and transpiration response to changing environmental conditions in floodplain forest
7. Scanning-Resonance Optical Sensing Based on a Laterally Graded Plasmonic Layer – Optical Properties of Agxal1−X in the Range of X = 0 to 1
8. Concordant element of the oxidation kinetics—Interpretation of ellipsometric measurements on Zr
9. Bloch surface waves biosensing in the ultraviolet wavelength range – Bragg structure design for investigating protein adsorption by in situ Kretschmann-Raether ellipsometry
10. Complementary physicochemical analysis by ellipsometry and Auger spectroscopy of nano-sized protective coating layers
11. Changes in composite nc-Si-SiO2 thin films caused by 20 MeV electron irradiation
12. Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions
13. Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study
14. Enhanced protein adsorption and cellular adhesion using transparent titanate nanotube thin films made by a simple and inexpensive room temperature process: Application to optical biochips
15. Preface
16. Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range
17. In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ spectroscopic ellipsometry measurements
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