6 results on '"Waltl, Michael"'
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2. Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture
3. Evaluation of the impact of defects on threshold voltage drift employing SiO2 pMOS transistors
4. Impact of single-defects on the variability of CMOS inverter circuits
5. Separation of electron and hole trapping components of PBTI in SiON nMOS transistors
6. Soft error hardening enhancement analysis of NBTI tolerant Schmitt trigger circuit
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