38 results on '"Fantini, F."'
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2. Reliability predictions in electronic industrial applications
3. High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT’s
4. Reliability in automotive electronics: a case study applied to diesel engine control
5. Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications
6. Reliability physics of compound semiconductor transistors for microwave applications
7. Evaluation of the hot carrier/ionizing radiation induced effects on the RF characteristics of low-complexity SiGe heterojunction bipolar transistors by numerical simulation
8. Low-temperature spectrally resolved cathodoluminescence study of degradation in opto-electronic and microelectronic devices
9. Reliability investigation of InGaP/GaAs HBTs under current and temperature stress
10. On the short and long term degradation of GaInP/GaAs heterojunction bipolar transistors
11. Lifetime extrapolation for IGBT modules under realistic operation conditions
12. A stochastic approach to failure analysis in electromigration phenomena
13. A proposal for a standard procedure for moderately accelerated electromigration tests on metal lines
14. Negative VBE shift due to base dopant outdiffusion in DHBT
15. Bipolar Schottky logic device failure modes due to contact metallurgical degradation
16. EPROM testing — Part II: Application to 16K N-channel devices
17. EPROM testing — part I: Theoretical considerations
18. Cmos reliability: A useful case history to revise extrapolation effectiveness, length and slope of the learning curve
19. Reliability problems in TTL-LS devices
20. Electromigration in thin-films for microelectronics
21. Anodic gold corrosion in plastic encapsulated devices
22. Updating of CMOS reliability
23. Investigation of information loss mechanisms in EPROMs
24. Failures induced by electromigration in ECL 100k devices
25. Reliability evaluation of plastic packaged devices for long life applications by THB test
26. Power GaAs MESFET: Reliability aspects and failure mechanisms
27. A comparison between normally and highly accelerated electromigration tests
28. On the effect of power cycling stress on IGBT modules
29. CORRELATION BETWEEN LIGHT EMISSION AND CURRENTS IN PSEUDOMORPHIC HEMT s
30. Thermal characterization of IGBT power modules
31. Analysis of hot electron degradations in pseudomorphic HEMTs by DCTS and LF noise characterization
32. Are high resolution resistometric methods really useful for the early detection of electromigration damage?
33. The thermally balanced bridge technique (TBBT): A new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripes
34. The effect of hot electron stress on the dc and microwave characteristics of AlGaAs/InGaAs/GaAs PHEMTs
35. Design of a test structure to evaluate electro-thermomigration in power ICs
36. Resistance changes due to Cu transport and precipitation during electromigration in submicrometric Al-0.5% Cu lines
37. Substance P and vasoactive intestinal polypeptide in the pathogenesis of psoriatic lesions
38. The new stentless aortic valve: clinical results of the first 100 patients.
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