1. A study on reflectivity limit of neutron supermirror
- Author
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Hirotoshi Hayashida, T. Ebisawa, Norio Achiwa, Seiji Tasaki, Masaaki Kitaguchi, Yuji Kawabata, Ryuji Maruyama, and Masahiro Hino
- Subjects
Physics ,Neutron supermirror ,Nuclear and High Energy Physics ,Silicon ,business.industry ,Incoherent scatter ,chemistry.chemical_element ,Substrate (electronics) ,Surface finish ,Reflectivity ,Optics ,chemistry ,Multilayer ,Surface roughness ,Wafer ,Absorption (electromagnetic radiation) ,business ,Instrumentation - Abstract
We have fabricated m= 2.9 NiC/Ti supermirror on a silicon wafer in which surface roughness is about 0.4 nm by ion beam sputtering technique. The reflectivity of supermirror at m =2.8 and 2.9 were 0.94 and 0.90, respectively. The reflectivity of 0.94 at m =2.8 is in the vicinity of theoretical limit including the effects of absorption and incoherent scattering. We show the experimental results and theoretical expectation based on a simple Debye-Waller roughness model, and discuss realistic reflectivity limit of supermirror deposited on the ordinary silicon substrate.
- Published
- 2009