1. Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading.
- Author
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Lambert, PK, Hustedt, CJ, Vecchio, KS, Huskins, EL, Casem, DT, Gruner, SM, Tate, MW, Philipp, HT, Woll, AR, Purohit, P, Weiss, JT, Kannan, V, Ramesh, KT, Kenesei, P, Okasinski, JS, Almer, J, Zhao, M, Ananiadis, AG, and Hufnagel, TC
- Subjects
X-Ray Diffraction ,Materials Testing ,Elasticity ,Stress ,Mechanical ,Weight-Bearing ,Pressure ,Time Factors ,Lasers ,Semiconductor ,Physical Sciences ,Chemical Sciences ,Engineering ,Applied Physics - Abstract
We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ~10(3)-10(4) s(-1) in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10-20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (~40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.
- Published
- 2014