1. Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques
- Author
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E.M. Lauridsen, Henry Proudhon, Jean-Yves Buffiere, Andrew T. King, Michael Herbig, James Marrow, Laurent Babout, Wolfgang Ludwig, Péter Reischig, Matériaux, ingénierie et science [Villeurbanne] (MATEIS), Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-Université de Lyon-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Institut National des Sciences Appliquées (INSA)-Université de Lyon-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), European Synchrotron Radiation Facility (ESRF), Respiratory Research Group, University of Manchester [Manchester]-School of Translational Medicine, University of Manchester [Manchester], Łódź University of Technology, Technical University of Denmark [Lyngby] (DTU), Centre des Matériaux (MAT), MINES ParisTech - École nationale supérieure des mines de Paris, and Université Paris sciences et lettres (PSL)-Université Paris sciences et lettres (PSL)-Centre National de la Recherche Scientifique (CNRS)
- Subjects
Diffraction ,Materials science ,business.industry ,General Engineering ,Phase-contrast imaging ,Synchrotron radiation ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Microstructure ,Synchrotron ,law.invention ,020303 mechanical engineering & transports ,Optics ,0203 mechanical engineering ,law ,[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] ,General Materials Science ,Crystallite ,Tomography ,0210 nano-technology ,business ,Electron backscatter diffraction - Abstract
The combination of synchrotron radiation x-ray imaging and diffraction techniques offers new possibilities for in-situ observation of deformation and damage mechanisms in the bulk of polycrystalline materials. Minute changes in electron density (i.e., cracks, porosities) can be detected using propagation based phase contrast imaging, a 3-D imaging mode exploiting the coherence properties of third generation synchrotron beams. Furthermore, for some classes of polycrystalline materials, one may use a 3-D variant of x-ray diffraction imaging, termed x-ray diffraction contrast tomography. X-ray diffraction contrast tomography provides access to the 3-D shape, orientation, and elastic strain state of the individual grains from polycrystalline sample volumes containing up to thousand grains. Combining both imaging modalities, one obtains a comprehensive description of the materials microstructure at the micrometer length scale. Repeated observation during (interrupted) mechanical tests provide unprecedented insight into crystallographic and grain microstructure related aspects of polycrystalline deformation and degradation mechanisms. © 2010 TMS.
- Published
- 2010
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