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This paper describes a procedure that computes seeds for LFSR-based generation of partially-functional broadside tests. Existing LFSR-based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed si in order to reduce the Hamming distance between the scan-in state pi that si creates and a reachable state rj . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage. [ABSTRACT FROM AUTHOR]

Previous interleavers designed for Serially Concatenated Codes (SCCs) have achieved a limited Minimum Hamming Distance (MHD) between the legitimate permutations of the encoded bit sequence. Hence, we propose a novel Evolutionary Algorithm (EA) capable of designing improved interleavers for SCCs, without artificially limiting the achievable MHD. As a result, increased MHDs and therefore reduced error floors are achieved, even if only a modest EA complexity can be afforded. [ABSTRACT FROM PUBLISHER]