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This article reports on service-oriented architecture. It discusses that functional definitions of service-oriented architecture exists, but they lack explicit specification attributes, such as encapsulation mechanisms and ownership. The authors provide a general-purpose, formal definition of service-oriented architecture that helps clarify some ambiguities surrounding the architecture by using Unified Modeling Language and Z-notation specification language. It discusses that service-oriented architecture is a distributed transaction scheme for attaining interoperability in heterogeneous distributed systems deployments.

This article discusses on several studies building on theories and research from several domains investigating how gender differences interact with software. Gender differences suggest that females process information and solve problems in different ways than males do. It investigates whether software design should take gender differences into account. It discusses gender human-computer interaction which refers to how software relates to gender differences. It focuses on how gender-neutral software works, not on gender-oriented content.

The article provides an overview of Echo, a high-performance event-delivery middleware designed to scale to the data rates typically found in grid-style computing environments. One of Echo's unique characteristics is its support for efficient transmission and handling of fully typed events. It supports the robust evolution of sets of programs communicating with events by allowing variation in the data types associated with a single channel. Echo has been in continuous use in applications ranging from corporate information flow models to high-performance scientific computations.

We describe a constrained test-generation procedure for synchronous sequential circuits embedded in a large design where scan is used to provide access to the inputs of the individual circuits. The constrained test-generation procedure generates test sequences, where each vector is obtained from the previous one by shifting the scan chain a limited number of positions. Such constrained sequences can be applied through a scan chain with minimal test-application time overhead due to scan. When a shift by a single positions is used to obtain each vector from the previous one, the constrained test sequences can allow functional (at-speed) testing of the circuit. Although constrained test sequences cannot achieve complete fault coverage, they reduce the overall test-application time required to achieve complete fault coverage when used together with unconstrained test sequences. We demonstrate these features through experimental results. [ABSTRACT FROM AUTHOR]