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The BeamCal detector, one of the calorimeters in the forward region of the International Linear Collider detector, will serve three purposes: ensure hermeticity of the detector for small polar angles, reduce the backscattering from beamstrahlung electron-positron pairs into the detector center, and provide a low-latency signal for beam diagnostics. The BeamCal specifications in terms of noise suppression, signal charge, pulse rate, and occupancy pose unique challenges in the front end and readout electronics design. The Bean–BeamCal instrumentation IC is the integrated circuit under study to fulfill these requirements. To process the signal charge at the International Collider pulse rate, the Bean uses switched-capacitor filters and a slow reset-release technique. Each channel has a 10-bit successive approximation analog-to-digital converter. The Bean also features a fast feedback adder capable of providing a low latency output for beam diagnostic purposes. This work presents the design and characterization of a 3-channel prototype of the Bean built to validate concepts while the final device will comprise 32 channels. [ABSTRACT FROM PUBLISHER]

Charge amplifiers represent the standard solution to amplify signals from capacitive detectors in high energy physics experiments. In a typical front-end, the noise due to the charge amplifier, and particularly from its input transistor, limits the achievable resolution. The classic approach to attenuate noise effects in MOSFET charge amplifiers is to use the maximum power available, to use a minimum-length input device, and to establish the input transistor width in order to achieve the optimal capacitive matching at the input node. These conclusions, reached by analysis based on simple noise models, lead to sub-optimal results. In this work, a new approach on noise analysis for charge amplifiers based on an extension of the gm/ID methodology is presented. This method combines circuit equations and results from SPICE simulations, both valid for all operation regions and including all noise sources. The method, which allows to find the optimal operation point of the charge amplifier input device for maximum resolution, shows that the minimum device length is not necessarily the optimal, that flicker noise is responsible for the non-monotonic noise versus current function, and provides a deeper insight on the noise limits mechanism from an alternative and more design-oriented point of view. [ABSTRACT FROM PUBLISHER]