26 results on '"Cai, Linlin"'
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2. Enhancing Temperature Immunity of Digital Circuit Against Aging : The Standard Cell Subset Method
3. Machine Learning Assisted Nanoscale Device Modeling for Nanosheet FETs with Process Variations
4. Optimized Programming Scheme Enabling Symmetric Conductance Modulation in HfO₂ Resistive Random-Access Memory (RRAM) for Neuromorphic Systems.
5. Thermal-Aware EM Reliability for Advanced Metal Interconnects of Complementary FET.
6. Self-Heating and Thermal Network Model for Complementary FET.
7. Efficient Variability- and Reliability-aware Device-Circuit Co-Design: From Trap Behaviors to Circuit Performance
8. Self-heating Induced Variability and Reliability in Advanced Logic Devices and Circuits
9. Trap Dynamics based 3D Kinetic Monte Carlo Simulation for Reliability Evaluation of UTBB MOSFETs
10. 3D Kinetic Monte Carlo Simulation of Electromigration in Multi-layer Interconnects
11. Thermal Crosstalk Characterization Using Temperature Dependent Leakage Current Through Gate Stacks.
12. Experiment Characterization of Front and Back Interfaces Impact on Back Gate Modulation in UTBB-FDSOI MOSFETs
13. Self-heating aware EM Reliability Prediction of Advanced CMOS Technology by Kinetic Monte Carlo Method
14. A Physics-based Thermal Model of Nanosheet MOSFETs for Device-Circuit Co-design
15. Entire Bias Space Statistical Reliability Simulation By 3D-KMC Method and Its Application to the Reliability Assessment of Nanosheet FETs based Circuits
16. Low-power, multilevel and analog characteristics in the multi-layer-oxide based RRAM devices compatible with CMOS technology
17. Analytical Model for Interface Traps-Dependent Back Bias Capability and Variability in Ultrathin Body and Box FDSOI MOSFETs.
18. New Measurement Method for Self-Heating in Silicon-on-Insulator MOSFETs Based on Shared Series Resistance.
19. A Physics-Based Analytic Model of Analog Switching Resistive Random Access Memory.
20. Insight into Effects of Oxygen Reservoir Layer and Operation Schemes on Data Retention of HfO2-Based RRAM.
21. Self-heating induced Variability and Reliability in Nanosheet-FETs Based SRAM
22. Investigation of self-heating effect on stacked nanosheet GAA transistors
23. Accurate self-heating assessment employing multi-stage thermal RC network
24. Analytical Multistage Thermal Model for FEOL Reliability Considering Self-and Mutual-Heating.
25. Layout Design Correlated With Self-Heating Effect in Stacked Nanosheet Transistors.
26. Design of Testbed System for Parallel HEV Powertrain
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