8 results on '"Chen, Yi-Heng"'
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2. Physical Mechanism for Different Phases and Turn-Around of Idsat in PMOS under HCI Stress
3. Investigation of Saturated Drain Current Change Phases For PMOS HCI Stressed at Ibmax
4. Research on SRAM Exhibiting Abnormal Behaviors of Electrical Characteristics after Accelerated Stress in Reliability
5. Failure mode study of inappropriate type design to evaluate reliability on TU geometry
6. 40nm NAND flash reliability failure analysis with identification tools combination
7. Cu via process optimization by electro-migration estimation testing.
8. Investigation of electrochemical migration on fine pitch BGA package
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