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Your search keyword '"Deshpande, Sameer"' showing total 9 results
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9 results on '"Deshpande, Sameer"'

1. Tungsten Interconnect Resistance Reduction Enabling Energy Efficient and High Performance Applications for 2nm Node and Beyond

Author

Thareja, Gaurav, primary, Pal, Ashish, additional, Ma, Quan, additional, Ching, Chi, additional, Patel, Sahil, additional, Gao, Xingyao, additional, Dag, Sefa, additional, Qi, Zhimin, additional, Zhang, Aixi, additional, Yue, Shiyu, additional, Lei, Wei, additional, Xu, Yi, additional, Lei, Yu, additional, Jiang, Hao, additional, You, Shi, additional, Zheng, Wenkai, additional, Hung, Raymond, additional, Costrini, Gregory, additional, Zhu, Qing, additional, Tran, Randy, additional, Gupta, Rohit, additional, Reddy, Vinod, additional, Vyas, Pratik B., additional, Hassan, Sajjad, additional, Cai, Man Ping, additional, Shen, Gang, additional, Chen, Zhebo, additional, Hou, Wenting, additional, Lei, Jianxin, additional, Wang, Rongjun, additional, Shen, Walters, additional, Deshpande, Sameer, additional, Huey, Sidney, additional, Tang, Jianshe, additional, Naik, Mehul, additional, Kesapragada, Sree, additional, Ayyagari-Sangamali, Buvna, additional, Bazizi, El Mehdi, additional, and Tang, Xianmin, additional

Published
2023
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2. BEOL Interconnect Innovation: Materials, Process and Systems Co-optimization for 3nm Node and Beyond

Author

Thareja, Gaurav, primary, Pal, Ashish, additional, Wang, Xingye, additional, Dag, Sefa, additional, You, Shi, additional, Sharma, Shashank, additional, Zhu, Qing, additional, Cervantes, Carmen L., additional, Hwang, Shinjae, additional, Spuller, Matthew, additional, Ng, Ben, additional, Kumar, Pradeep S., additional, Tam, Norman, additional, Gage, Max, additional, Deshpande, Sameer, additional, Wu, Zhiyuan, additional, Jansen, Alexander, additional, Dey, Liton, additional, Chen, Feng, additional, Xie, Xianjin, additional, Kashefizadeh, Keyvan, additional, Reddy, Vinod, additional, Lo, Andy, additional, Chen, Zhebo, additional, Huey, Sidney, additional, Tang, Jianshe, additional, Ren, He, additional, Naik, Mehul, additional, Brown, Brian, additional, Kesapragada, Sree, additional, Sangamali, Buvna Ayyagari-, additional, Bazizi, El Mehdi, additional, and Tang, Xianmin, additional

Published
2023
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3. MOL Local Interconnect Innovation: Materials, Process & Systems Co-optimization for 3nm Node and Beyond

Author

Pal, Ashish, primary, Thareja, Gaurav, additional, Dag, Sefa, additional, Costrini, Gregory, additional, Reddy, Vinod, additional, Xu, Yi, additional, Lei, Yu, additional, Zhang, Aixi, additional, Shen, Gang, additional, Jansen, Alexander, additional, Chen, Zhebo, additional, Gage, Max, additional, Tang, Jianshe, additional, Yang, Yen-Chu, additional, Deshpande, Sameer, additional, Huey, Sidney, additional, Hung, Raymond, additional, Jiang, Hao, additional, Cai, Man-Ping, additional, Abramovitz, Yaniv, additional, Engel, Lior, additional, Naik, Mehul, additional, Wang, Rongjun, additional, Kesapragada, Sree, additional, Ayyagari-Sangamalli, Buvna, additional, Tang, Xianmin, additional, and Bazizi, El Mehdi, additional

Published
2022
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9. Impact of CMP Consumables on Copper Metallization Reliability.

Author

Obeng, Yaw S., Ramsdell, Jeff E., Deshpande, Sameer, Kuiry, Suresh C., Chamma, Karima, Richardson, Kathleen A., and Seal, Sudipta

Subjects
POLYMERS, COPPER, INTEGRATED circuits, POLYURETHANES, HYDROGEN peroxide, MICROELECTRONICS
Abstract

Over the past few years, the chemical mechanical planarization (CMP) community has systematically characterized the device reliability issues associated with the introduction of copper metallization into integrated circuit fabrication. To gain further understanding of the impact of CMP processing on device performance, this paper reports in detail the interactions of simulated copper slurries and pristine segmented polyurethanes. These studies clearly show that polyurethane is fundamentally incompatible with some of the chemicals used in copper CMP, such as hydrogen peroxide. Experimental copper polishing data on both polyurethane and polyolefin-based pads are compared. The pad performance differences between the polyurethane and polyolefin- based pads are explained based on the chemistry of the base polymers used in the pad fabrication. These results are incorporated into the design and fabrication of a new class of polyolefins-based application specific pads. [ABSTRACT FROM AUTHOR]

Published
2005
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