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6. Understanding of BTI for tunnel FETs

8. PBTI for N-type tunnel FinFETs

9. Experimental study of variability in polycrystalline and crystalline silicon channel FinFET CMOS inverters

10. Accurate prediction of PBTI lifetime for N-type fin-channel tunnel FETs

15. Hyperspectroscopic imager for baby fibers

16. Fabrication and characterization of 3D fin-channel MANOS type flash memory

18. Lowest variability SOI FinFETs having multiple Vt by back-biasing

21. Analysis of Vth flexibility in ultrathin-BOX SOI FinFETs

22. Charge trapping type FinFET flash memory with Al2O3 blocking layer

24. Analysis of threshold voltage shifts in double gate tunnel FinFETs: Effects of improved electrostatics by gate dielectrics and back gate effects

26. Experimental study of tri-gate SOI-FinFET flash memory

27. Cryogenic operation of double-gate FinFET and demonstration of analog circuit at 4.2K

28. Flexible Vth FinFETs with 9-nm-thick extremely-thin BOX

31. Influence of fin height on poly-Si/PVD-TiN stacked gate FinFET performance

35. Optimization of RTA process for PVD-TiN gate FinFETs

36. High-frequency characterization of intrinsic FinFET channel

43. Variation analysis of TiN FinFETs

49. Characterization of metal-gate FinFET variability based on measurements and compact model analyses

50. Logic gate threshold voltage controllable single metal gate FinFET CMOS inverters implemented by using co-integration of 3T/4T-FinFETs

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