22 results on '"He, Jiabei"'
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2. Dynamic Interplays of Gate Junctions in Schottky-type p-GaN Gate Power HEMTs during Switching Operation
3. Gate Reliability of Schottky-Type p -GaN Gate HEMTs Under AC Positive Gate Bias Stress With a Switching Drain Bias.
4. A Verifiable Privacy-Preserving Machine Learning Prediction Scheme for Edge-Enhanced HCPSs.
5. Low-Temperature Accelerated Gate Reliability of Schottky-type p-GaN Gate HEMTs
6. Impact of Hole-Deficiency and Charge Trapping on Threshold Voltage Stability of p-GaN HEMT under Reverse-bias Stress
7. Reverse-Bias Stability and Reliability of Enhancement-mode GaN-based MIS-FET
8. Incorporating the Dynamic Threshold Voltage Into the SPICE Model of Schottky-Type p-GaN Gate Power HEMTs.
9. Dynamic Threshold Voltage in $p$-GaN Gate HEMT
10. Temperature-Dependent Gate Degradation of $p$-GaN Gate HEMTs under Static and Dynamic Positive Gate Stress
11. Research on Influencing Factors of Users' Adoption Intention of WeChat Marketing
12. p-GaN Gate HEMT With Surface Reinforcement for Enhanced Gate Reliability.
13. Characterization of Static and Dynamic Behavior of 1200 V Normally off GaN/SiC Cascode Devices.
14. Identification of Trap States in p-GaN Layer of a p-GaN/AlGaN/GaN Power HEMT Structure by Deep-Level Transient Spectroscopy.
15. Hole-Induced Degradation in E-Mode GaN MIS-FETs: Impact of Substrate Terminations.
16. High-speed, high-reliability GaN power device with integrated gate driver
17. Reverse-bias stability and reliability of hole-barrier-free E-mode LPCVD-SiNx/GaN MIS-FETs
18. Frequency- and Temperature-Dependent Gate Reliability of Schottky-Type ${p}$ -GaN Gate HEMTs.
19. Charge Storage Mechanism of Drain Induced Dynamic Threshold Voltage Shift in ${p}$ -GaN Gate HEMTs.
20. VTH Instability of ${p}$ -GaN Gate HEMTs Under Static and Dynamic Gate Stress.
21. Hole-Induced Threshold Voltage Shift Under Reverse-Bias Stress in E-Mode GaN MIS-FET.
22. Performance and VTH Stability in E-Mode GaN Fully Recessed MIS-FETs and Partially Recessed MIS-HEMTs With LPCVD-SiNx/PECVD-SiNx Gate Dielectric Stack.
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