228 results on '"Koga R"'
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2. The Aerospace Corporation's Compendium of Recent Radiation Testing Results
3. Proton Induced Single Event Effects on the Arria 10 Commercial off-the-shelf CMOS Field Programmable Gate Array
4. The Aerospace Corporation’s Compendium of Recent Radiation Testing Results
5. The Aerospace Corporation's Compendium of Recent Radiation Testing Results
6. Heavy Ion Induced Single Event Effects Characterization of the XQE-0920 Commercial Off-the-shelf CMOS Photonic Imager Microcircuit
7. Trend in Measured SEL Sensitivity with Increasing Proton Induced Total Ionizing Dose to1Mrad(Si) on Zynq UltraScale Plus XCZU9EG FPGA
8. The Aerospace Corporation’s Compendium of Recent Radiation Effect Results
9. Radiation Effects Testing of Selected Voltage Regulator Microcircuits with Heavy Ions and Protons
10. The Aerospace Corporation’s Compendium of Recent Single Event Effect Results
11. Heavy Ion and Proton Induced Single Event Effects on Xilinx Zynq UltraScale+ Field Programmable Gate Array (FPGA)
12. SEE and TID Testing of Components for the Near Infrared Airglow Camera (NIRAC)
13. Proton and Heavy Ion Testing of the Microsemi Igloo2 FPGA
14. Heavy Ion and Proton Induced Radiation Effects on Differential Bus Transceiver Microcircuits
15. SEE and TID Effects in Transistors and Voltage Reference Devices
16. Proton and Heavy Ion Sensitivity of Commercial Instrumentation and Precision Operational Amplifiers
17. Heavy Ion and Proton Induced Radiation Effects on Commercial Analog Switch Microcircuits
18. Proton and Heavy Ion Sensitivity of Commercial Reference Voltage and Voltage Regulator Devices
19. Increasing AC-field frequency in microwave-assisted magnetic recording
20. Response Variability in Commercial MOSFET SEE Qualification.
21. Proton on Metal Fission Environments in an IC Package: An RHA Evaluation Method.
22. Charged Particle Induced Degradation of Trench Type n-Channel Power MOSFETs
23. Compendium of Ball Aerospace TID, DDD, and SEE Test Results
24. Single Event Effects Sensitivity of 180 and 350 nm SiGe HBT Microcircuits
25. Single Event Effects Sensitivity of DDR3 SDRAMs to Protons and Heavy Ions
26. Single Event Sensitivity of High-Speed Differential Signaling Devices to Heavy Ions and Protons
27. Proton-Induced Single Event Upsets in 90nm Technology High Performance SRAM Memories
28. Development of equivalent circuit model with transmission line model for designing filters formed on printed circuit boards
29. Prediction of EMI from two-channel differential signaling system based on imbalance difference model
30. Sensitivity of 2 Gb DDR2 SDRAMs to Protons and Heavy Ions
31. Synergistic Effects of Total Ionizing Dose on SEU Sensitive SRAMs
32. Single Event Effects and Total Dose Test Results for TI TLK2711 Transceiver
33. Proton and Heavy Ion Induced Semi-Permanent Upsets in Double Data Rate SDRAMs
34. RHA Implications of Proton on Gold-Plated Package Structures in SEE Evaluations.
35. Single Event Effects Sensitivity of the Q Series Advanced CMOS Technology
36. Single Event Upsets in Xilinx Virtex-4 FPGA Devices
37. Radiation Performance of 1 Gbit DDR SDRAMs Fabricated in the 90 nm CMOS Technology Node
38. EMI antenna model based on common-mode potential distribution for fast prediction of radiated emission
39. Stopband characteristics of planar-type electromagnetic bandgap structure with ferrite film.
40. Single Event Effects Tests on the Actel RTAX2000S FPGA.
41. De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB -examinations in one-port measurements-.
42. Estimation of radiated emissions from multilayered printed circuit board by common-mode antenna model.
43. Neutron Soft Errors in Xilinx FPGAs at Lawrence Berkeley National Laboratory.
44. Suppressing power bus resonance and radiation using magnetic material and EBG structure.
45. EMI simulation based on cavity-mode model for power-bus radiation calculation of power/ground planes with IC/LSI.
46. Experimental validation of imbalance difference model to estimate common-mode excitation in PCBs.
47. EMC macro-modeling of CMOS inverter using LECCS-I/O model with additional current source.
48. Prediction of the common-mode radiated emission from the board to board interconnection through common-mode antenna model.
49. Modeling of microcontroller with multiple power supply pins for conducted EMI simulations.
50. Fast Calculation of Radiated Emissions from Arbitrarily Shaped PCB with IC/LSI.
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