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Cd 0.9 Zn 0.1 Te (CZT) gamma radiation detectors are presently among the best semiconductor materials for room temperature operation. CZT crystals in pixilated geometry can be efficiently used in the field of Homeland security and medical diagnosis for high resolution imaging purpose and position sensitive measurements using x-rays and high energy gamma rays. Large area CZT single crystals has been grown using a tellurium solvent method. A 10×10 guarded pixilated detector has been fabricated on a ∼19.5×19.5×5 mm3 crystal cut out from the grown ingot. A full area planar Au contact was used as the cathode. Each pixel of the pixilated detector was 1.3×1.3 mm2 in area and pitched at 1.8 mm. A 100 μm wide guard grid was used to reduce inter-pixel leakage. The crystal was characterized in planar configuration using electrical and optoelectronic methods prior to the fabrication of pixilated geometry. Current-voltage (I–V) measurements revealed a leakage current of 29 nA at an operating bias voltage of 1100 V. A resistivity of ∼3.1×1010 ∖.cm was calculated from the I–V measurements. Infrared transmission imaging revealed an average tellurium inclusion/precipitate size less than 8μm. Pockels measurement has revealed a near-uniform depth-wise distribution of the internal electric field. The mobility-lifetime product in this crystal was calculated to be 6.2 × 10−3 cm2/V using alpha ray spectroscopic method. Gamma spectroscopy using a 137Cs source on the pixelated structure showed fully resolved 662 keV gamma peaks for all the pixels, with percentage resolution (FWHM) as low as 1.8 %.

We are developing new scintillator materials that offer potential for high resolution gamma ray spectroscopy at low cost. Single crystal SrI 2 (Eu) offers ∼3% resolution at 662 keV, in sizes of ∼1 in3. We have developed ceramics processing technology allowing us to achieve cubic inch scale transparent ceramic scintillators offering gamma spectroscopy performance superior to NaI(Tl). Our bismuth-loaded plastic scintillator demonstrates energy resolution of ∼8% at 662 keV, for samples of ∼0.5 cm3.

This paper presents a method for measuring the electric and magnetic field with one sensor. The solution suggested is a simple one, and makes possible the extension, under 100 kHz, of the frequency range of the sensors used for electric and magnetic field measurements in the same place in space.