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As a step toward realizing the quantum current standard, single-electron pumping of parallel SINIS turnstiles was performed. Eleven SINIS turnstiles were fabricated on the same chip, and the number of operating SINIS turnstiles was increased one by one. As a result, 11 turnstiles were operated simultaneously up to 100 MHz, resulting in a pumped dc of 176.2 pA. We also did a linearity check toward parallelization. This paper for increasing the pumped current by parallelization will lead to practical use of stable and accurate dc sources with tiny values of the output current and the metrology triangle experiment for SI redefinition. [ABSTRACT FROM PUBLISHER]

It has been several years since InGaN/GaN light-emitting diodes (LEDs) on nonpolar and semipolar orientations were first demonstrated. Prominent performance and inherent potential of these crystallographic orientations have been revealed as bulk-GaN substrates of arbitrary orientations became available for epitaxial device growth. At this point in time, intend to survey the progress made to date and prospect the future requirements for further device improvements. The discussion begins with a historical background: how nonpolar/semipolar orientations were introduced to III-nitride LEDs and why they are beneficial. The discussion then provides information on elementary crystallography and piezoelectricity in addition to the electronic band structure of wurtzite crystals. Later in this paper, LED reports are collected to develop comprehensive knowledge of the past research efforts and trends. Nonpolar and semipolar orientations provide not only high LED performances, e.g., optical output power and wavelength ranges, but also unique functions, e.g., polarized light emission, which will explore new fields of applications. [ABSTRACT FROM AUTHOR]

The recent progress in III-nitride tunnel junction (TJ) contacts for optoelectronic devices is summarized in this review paper. Due to the rapid developments of various III-nitride based optoelectronic devices for different emerging applications, TJs are of interest for these devices to achieve more efficient device performance. This review paper first briefly describes the working principles of TJs and the advantages of employing TJs in optoelectronic devices. The significant advancements in III-nitride TJs realized by metalorganic chemical vapor deposition (MOCVD) and molecular beam epitaxy (MBE) are addressed, as well as their TJ device performances. Lastly, the critical challenges for employing III-nitride TJs in wide bandgap ultraviolet (UV) light emitters are discussed for future investigations. [ABSTRACT FROM AUTHOR]

Nitride based light emitting diodes (LEDs) have demonstrated very high efficiency in the blue and green wavelength ranges. For full color LED based displays, efficient and small sized devices emitting in the three primary colors - red, green and blue are required. While phosphide based red LEDs are highly efficient, high surface recombination velocities limit their scaling to small dimensions. Nitride emitters can be scaled to smaller sizes, however for longer emission wavelength such as yellow, orange, and red, the indium content in the active region of the devices needs to be >30%. Due to the large lattice mismatch between GaN and InN, the needed high indium content introduces a large strain in the structure, often resulting in poor material quality. Recently, a novel technique to mitigate this lattice mismatch induced strain was demonstrated with the use of compliant porous GaN underlayer based substrates. In our previous reports, we have discussed the surface morphology, strain state evolution and device demonstrations using these substrates, however a detailed discussion regarding the pore cross-sections and dislocation propagation for each generation of these porous GaN substrates was yet to be reported. In this work, we will discuss the cross-sectional transmission electron microscopy (TEM) results of these substrates across multiple stages of the substrate technology development. [ABSTRACT FROM AUTHOR]

AlGaN germicidal ultraviolet (GUV) light emitting diodes (LEDs) are one of the most promising disinfection technologies in fighting the COVID-19 pandemic; however, GUV LEDs are still lacking in efficiency due to low p-type doping efficiency in p-AlGaN. The most successful approach for producing conductive p-type AlGaN is the implementation of a polarization-enhanced short period Al $_{\mathbf {x}}$ Ga $_{\mathbf {1-}\mathbf {x}}$ N/Al $_{\mathbf {y}}$ Ga $_{\mathbf {1-}\mathbf {y}}$ N superlattice (SL) structure, which enhances hole injection and reduces device operating voltage. In this report, we investigated different aspects of the superlattice including the Al $_{\mathbf {x}}$ Ga $_{\mathbf {1-}\mathbf {x}}$ N and Al $_{\mathbf {y}}$ Ga $_{\mathbf {1-}\mathbf {y}}$ N alloy constituent compositions, ${x}$ and ${y}$ , period thickness, total thickness, and Mg dopant concentration in terms of LED performance as well as electrical, optical, and morphological characteristics. The polarization-enhanced p-type doping in the AlGaN superlattice was also investigated computationally, giving excellent agreement with experimental results. Highly efficient UVC LEDs (279 nm) with EQE of 2% at 5 A/cm2 were demonstrated. A maximum output power of 5.5 mW (56 mW/mm2) was achieved at 100 mA. [ABSTRACT FROM AUTHOR]

Single crystals of Sn0.02Bi1.08Sb0.9Te2S are grown and their transport properties are evaluated to precisely measure the quantum Hall effect on the metallic surface state of the topological insulator. The temperature dependence of the electrical resistance of the bulk samples is determined. The conduction in the material is explained by the parallelism of the inner bulk conduction and the metallic surface conduction. At low temperatures, surface conduction is the dominant one of the two. In order to measure thinner flakes of the material with an appropriate charge carrier control, the material is processed into measurement devices with the conventional lithography method. Device evaluation is also introduced. [ABSTRACT FROM AUTHOR]