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1. Increase in transient resistance of Bi2223 superconducting bulk by applying external magnetic field

2. Simulation of Switching Overvoltages and Validation With Field Tests.

12. Present state and future plan of standard model development for smart grid simulations

25. Advanced 2D/3D simulations for laser annealed device using an atomistic kinetic Monte Carlo approach and Scanning Spreading Resistance Microscopy (SSRM)

26. Laser-annealed junctions with advanced CMOS gate stacks for 32nm Node: Perspectives on device performance and manufacturability

27. Laser Annealed Junctions: Process Integration Sequence Optimization for Advanced CMOS Technologies

28. Analysis of As, P Diffusion and Defect Evolution during Sub-millisecond Non-melt Laser Annealing based on an Atomistic Kinetic Monte Carlo Approach

30. Optimization of Sub-Melt Laser Anneal: Performance and Reliability

32. NMOS and PMOS Metal Gate Transistors with Junctions Activated by Laser Annealing

33. Analysis of Dopant Diffusion and Defect Evolution during sub-millisecond Non-melt Laser Annealing based on an Atomistic Kinetic Monte Carlo Approach

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