37 results on '"Philippe, Descamps"'
Search Results
2. Combined Hybrid mm-Waves and Optics Sensing with Smart Data Fusion for Autonomous Vehicles
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Philippe Descamps, Sidina Wane, and Philippe Eudeline
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Signal processing ,Computer science ,Phased array ,Emerging technologies ,05 social sciences ,MIMO ,Advanced driver assistance systems ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Computer architecture ,RFIC ,0501 psychology and cognitive sciences ,Augmented reality ,0210 nano-technology ,050107 human factors ,Virtual prototyping - Abstract
Combination of cognitive mm-Wave MIMO Phased Array systems with Optical Sensing solutions is proposed toward new functionalities for environmental perceptions and ubiquitous interactions. The resulting paradigms will operate the unification of mm-Wave and optical sensing solutions for enabling emerging technologies relative to interactions of humans with smart devices and systems in randomly changing environments. Perspectives for Autonomous Vehicles with Advanced Driver Assistance Systems (ADAS) including Gesture-Recognition (GR) through ubiquitous interactions based on hybrid cognitive mm-Wave RFIC technologies and optical systems are drawn. Several hardware realizations of mm-Wave phased-arrays are built and co-assembled with optical systems for smart data fusion and real-time co-array signal processing for autonomously secure decision making process. Unified modeling and measurement platform is proposed with the concept of Multi-Physics (EM-Thermal-Mechanical) Numerial-Co-Simulation-Clone (NCSC), seen as the counter-part of the functional hardware, which enables 4D (space-time evolution) Virtual Prototyping (VP) of augmented reality.
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- 2019
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3. Evaluation of substrate's characteristics from the relation between wave and characteristic impedances for a CPW
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Kassem Hamze, Philippe Descamps, Cedric Mayor, Daniel Pasquet, Christian Gautier, and Dominique Lesenechal
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Inductance ,Permittivity ,Materials science ,Condensed matter physics ,Physics::Optics ,Dielectric ,Relative permeability ,Electrical impedance - Abstract
The variation of the linear inductance of a CPW with the frequency is used to extract the effective permeability that depends on the metallic losses. The result allows to separate the dielectric and metallic losses and to calculate some characteristics of the waveguide.
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- 2018
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4. Simulation and analysis of DC and RF performances degradation of NMOS transistors under hot carrier injection mechanism
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Philippe Descamps, Insaf Lahbib, Patrick Martin, Guy Imbert, and Aziz Doukkali
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010302 applied physics ,Materials science ,business.industry ,Transconductance ,Transistor ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Threshold voltage ,law.invention ,Current mirror ,CMOS ,law ,0103 physical sciences ,Optoelectronics ,0210 nano-technology ,business ,NMOS logic ,Hot-carrier injection ,Electronic circuit - Abstract
In this paper, hot carrier injection mechanism effect on DC and RF performances of n-channel transistors of a 0.25μ CMOS technology in function of gate-source voltage are investigated using an in-house reliability simulation tool. The study concludes that after 10 years of DC stress, transistors present about 50% decrease of linear drain current, a 40% decrease of saturation drain current, as well as a reduction of 95% in transconductance and 90% in the transition frequency. Last but not least, the threshold voltage is increased by 0.55 V after stress. Predicted results are compared to hot carrier model in order to validate the accuracy of the simulator. Reliability analysis is extended to circuits' degradation under hot carrier mechanism to raise awareness of circuit-level reliability simulation interest. A comparison between two typical current mirrors circuits behavior after hot carrier stress has been made.
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- 2017
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5. Reliability analysis of low noise amplifiers for wireless applications under high RF power stressing
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Patrick Martin, Patrice Gamand, Philippe Descamps, Insaf Lahbib, Aziz Doukkali, and Dominique Lesenechal
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010302 applied physics ,Computer science ,business.industry ,Amplifier ,020208 electrical & electronic engineering ,dBm ,RF power amplifier ,02 engineering and technology ,Noise figure ,01 natural sciences ,Reliability (semiconductor) ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,Optoelectronics ,Cascode ,Radio frequency ,business ,Degradation (telecommunications) - Abstract
A reliability study under high RF power stressing was conducted on two SiGe cascode Low Noise Amplifiers (LNA) using an in-house reliability tool. The first LNA was stressed at 19 dBm of RF power during 600 hours. Obtained results (relative degradation values in dB) showed a decrease of 11% in the small-signal gain (S 21 ), while the second was stressed at 20 dBm of RF power during non-stop 600 hours. The results, under these conditions, showed a decrease of 12% in the S 21 and an increase of 13.8% in the Noise Figure (NF). All predictive degradation simulations were compared to measurements demonstrating a satisfactory agreement.
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- 2017
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6. Reliability analysis of BiCMOS SiGe:C technology under aggressive conditions for emerging RF and mm-Wave applications
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Damienne Bajon, Laurent Leyssenne, Cristian Andrei, G. Rolland, Aziz Doukkali, Guy Imbert, Philippe Descamps, Thanh Vinh Dinh, Dominique Lesenechal, Rosine Coq Germanicus, Guillaume Boguszewski, Sidina Wane, Franqoise Bezerra, Patrick Martin, and Insaf Lahbib
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010302 applied physics ,Materials science ,010308 nuclear & particles physics ,Amplifier ,Integrated circuit ,BiCMOS ,01 natural sciences ,Silicon-germanium ,law.invention ,Stress (mechanics) ,chemistry.chemical_compound ,Reliability (semiconductor) ,chemistry ,law ,0103 physical sciences ,Electronic engineering ,Stress conditions ,Radio frequency - Abstract
In this contribution, impact of extreme environmental conditions in terms of energy-level radiation of protons on SiGe integrated circuits is experimentally studied. Canonical representative structures including linear (passive interconnects/antennas) and non-linear (Low Noise Amplifiers) are used as carriers for assessing impact of aggressive stress conditions on their performances. Perspectives for holistic Modeling and Characterization approaches accounting for various interaction mechanisms (substrate resistivity variations, couplings/interferences, drift in DC and RF characteristics, for actives are down to allow for optimal solutions in pushing SiGe technologies toward applications with harsh and radiation-intense environments (e.g., Space, Nuclear, Military). Specific design prototypes are built for assessing mission-critical profiles for emerging RF and mm-Wave applications.
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- 2017
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7. Accurate FEM base nMOS switch modelling technique for RF applications
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Nathalie Jourdan, Philippe Descamps, Fadoua Gacim, Laboratoire de cristallographie et sciences des matériaux (CRISMAT), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), NXP Semiconductors [France], École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Normandie Université (NU)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), and Normandie Université (NU)-Institut de Chimie du CNRS (INC)
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Engineering ,Substrate loss ,Design flow ,02 engineering and technology ,BiCMOS integrated circuits ,01 natural sciences ,Modelling ,Radio frequency ,0103 physical sciences ,[CHIM.CRIS]Chemical Sciences/Cristallography ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,[CHIM]Chemical Sciences ,Figure of merit ,Parasitic extraction ,Full wave ,S-parameters ,Parasitics ,NMOS logic ,010302 applied physics ,Substrates ,business.industry ,Finite element analysis ,020206 networking & telecommunications ,[CHIM.MATE]Chemical Sciences/Material chemistry ,RF characteristics ,Bicmos technology ,Finite element method ,[CHIM.THEO]Chemical Sciences/Theoretical and/or physical chemistry ,Amplitude ,Integrated circuit modeling ,NMOS switch ,Compatibility (mechanics) ,business ,Switches ,MOS devices ,Partitioning - Abstract
International audience; This paper teaches the way full-wave modelling methodology that has been considered for nMOS switch in BiCMOS technology process. A method mixing both RC extraction based method, in combination with Electromagnetic 3D FEM simulations is presented. This method allows a physical full-wave extraction of the substrate taking into account both shallow and deep trenches isolation. Partitioning methodology which is really key in that case is described keeping in mind its compatibility with commercial automated design flows. To support theoretical investigations, 2-ports S-parameters measurements are compared with simulated data obtained from the proposed method. From available results, a good correlation is obtained on both input and return losses (amplitude + phase) over a wide frequency range (up to 10 GHz). Parameters such as Coff and Ron are also compared and FOM (Figure Of Merit) is also issued. Typically a difference less than 50 mdB is obtained for insertion losses. © 2016 European Microwave Association.
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- 2016
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8. Characterization of anisotropic substrates from RF, mm-Wave to THz: Design of 3D conformal antenna for connected objects
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Damienne Bajon, Tanh Vinh Dinh, Audrey Cayron, Dominique Lesenechal, Sidina Wane, Laurent Leyssenne, Philippe Descamps, Sebastien Massenot, and Bernadette Domengès
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Materials science ,business.industry ,Terahertz radiation ,Wearable computer ,020206 networking & telecommunications ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Laser ,Refraction ,Characterization (materials science) ,law.invention ,Optics ,law ,0202 electrical engineering, electronic engineering, information engineering ,Optoelectronics ,Antenna (radio) ,0210 nano-technology ,business ,Anisotropy ,Absorption (electromagnetic radiation) ,ComputingMethodologies_COMPUTERGRAPHICS - Abstract
Anisotropic Liquid Crystal Polymer (LCP) substrates are used to design 3D conformal antenna elements and filtering structures in Laser Direct Structuring technology (LDS) for applications including 5G connected objects and massive Internet of Things (IoT): e.g., wearable (smart watches/rings), mobile (smartphones/tablets), home (appliances/lighting) devices. Based on the experimentally extracted optical absorption and refraction properties, identification of chemical and/or morphologic composition of the characterized samples (solid and liquid materials) are targeted. Perspectives for macro-modeling of composite materials and nano-Particles using homogeneization techniques are drawn.
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- 2016
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9. Multi-transmission lines (MTL) loaded by nonlinear lumped elements on 2.5D: FDTD approach
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Philippe Descamps, Ismail Alaoui Abdallaoui, and Hassane Kabbaj
- Subjects
Nonlinear system ,Electric power transmission ,Electronic engineering ,Finite difference ,Finite difference method ,Finite-difference time-domain method ,Boundary value problem ,Topology ,Finite element method ,Mathematics ,Voltage - Abstract
In this paper, we are interested on studying the Multi-Transmission Lines, the analysis is ensured by the Finite Difference Temporal Domain FDTD method combined with the absorbing boundary conditions (ABC) to predict the current and voltage behavior resulting from the electromagnetic fields all along lines. Simulated results will be compared to commercial software to validate the proposed algorithm.
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- 2016
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10. Integration of Lange Couplers in SiGe BiCMOS technology for RF and mm-Wave applications perspectives for distributed Chip-Package-PCB Co-integration
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Laurent Leyssenne, Dominique Lesenechal, Damienne Bajon, Aykut Erdem, Sidina Wane, O. Doussin, Olivier Tesson, P.H.C. Magnee, Thanh Vinh Dinh, Philippe Descamps, M.P. van der Heijden, and Ralf Pijper
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Engineering ,business.industry ,Ground ,Electrical engineering ,BiCMOS ,Lange coupler ,Network topology ,Chip ,Bicmos technology ,Die (integrated circuit) ,Reduction (complexity) ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,business - Abstract
SiGe BiCMOS design solutions for Lange Couplers operating in the mm-Wave domain are proposed. Various circuit topologies are designed, fabricated, and experimentally compared in terms of their RF performances. Effect of grounding strategies and influence of DTI pattering are studied both for CPS and CPW topologies to evaluate dependence of obtained RF performances on Die back-side grounding strategies. Perspectives for feasibility of distributed Chip-Package-PCB Co-integration of Lange coupler devices are drawn for loss reduction and improved matching to external input sources and antennas.
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- 2015
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11. Modeling and characterization of bond-wire arrays for distributed Chip-Package-PCB Co-design
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Bernadette Domengès, Dominique Lesenechal, Thanh Vinh Dinh, Olivier Doussin, Laurent Leyssenne, D. Bajon, Sidina Wane, Daniel Pasquet, and Philippe Descamps
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Co-design ,Permittivity ,Engineering ,business.industry ,Molding (process) ,Chip ,Characterization (materials science) ,Microwave applications ,ComputerApplications_MISCELLANEOUS ,Broadband ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,Parasitic extraction ,business - Abstract
In this paper, modeling and experimental characterization of bond-wire arrays are proposed based on dedicated pilote carriers designed and fabricated for RF and microwave applications. Effects of the number of wire elements, connected in parallel to build bond-wire arrays, on the values of extracted broadband parasitics are investigated. Physical characterization of molding compound materials is proposed for their structural analysis and for broadband extraction of their dielctric properties (complex permittivity). Influence of molding compound properties on extracted parasitics of bond-wire arrays is highlighted.
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- 2015
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12. Design of Lange Couplers with local ground references using SiGe BiCMOS technology for mm-Wave applications
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Laurent Leyssenne, Aykut Erdem, M.P. van der Heijden, Olivier Tesson, Sidina Wane, Ralf ZPijper, Thanh Vinh Dinh, Damienne Bajon, Dominique Lesenechal, P.H.C. Magnee, Philippe Descamps, and O. Doussin
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Engineering ,business.industry ,Ground ,Electrical engineering ,Hardware_PERFORMANCEANDRELIABILITY ,BiCMOS ,Network topology ,Die (integrated circuit) ,Broadband ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,Equivalent circuit ,RLC circuit ,Radio frequency ,business - Abstract
SiGe BiCMOS design solutions for Lange Couplers operating in the mm-Wave domain are proposed. Various circuit topologies are designed, fabricated, and experimentally compared in terms of their RF performances. Effect of grounding strategies and influence of DTI pattering are studied both for CPS and CPW topologies to evaluate dependence of obtained RF performances on Die back-side grounding strategies. Perspectives for physics-based broadband equivalent circuit model extraction are proposed for lumped elements implementation of Lange Couplers using custom variation-aware RLC library elements.
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- 2015
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13. A prototype of laser-hollowed integrated circuit for dielectric sensing of liquids: Perspectives for medical applications
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L. Leyssenne, F. Kerisit, Philippe Descamps, I. Lahbib, D. Lesénéchal, B. Domengès, Sidina Wane, and N. Prou
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Materials science ,business.industry ,law ,Electrical engineering ,Optoelectronics ,Integrated circuit ,Dielectric ,business ,Laser ,law.invention - Published
- 2014
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14. A microwave real-time dielectric sensor based on a K-band BICMOS LC oscillator
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Philippe Descamps, Sidina Wane, I. Lahbib, D. Lesénéchal, L. Leyssenne, Thanh Vinh Dinh, and N. Prou
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Materials science ,Electronic oscillator ,business.industry ,K band ,Gate dielectric ,Electrical engineering ,Optoelectronics ,Dielectric ,BiCMOS ,business ,Microwave - Published
- 2014
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15. A new 3D-PICS High density Integrated Passive Device with substrate noise reduction by localized P+ guard rings: Characterization and modeling
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Jean-Luc Levebfre, Daniel Pasquet, F. Voiron, Miled Ben Salah, and Philippe Descamps
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Coupling ,Engineering ,Substrate coupling ,Silicon ,business.industry ,Noise reduction ,Electrical engineering ,chemistry.chemical_element ,Chip ,law.invention ,Capacitor ,chemistry ,law ,Optoelectronics ,Transceiver ,business ,ISM band - Abstract
This paper presents an original concept of a 3D-PICS High density Integrated Passive Device Technology with P+ guard rings realized in a 300µm depth High Resistivity Silicon Substrate (HRS) in order to reduce significantly the substrate noise coupling. In this paper, a 3D-PICS IPD test chip was studied as the passive part prototype of a System-In-Package chip in combination with RF transceiver operating in the ISM band (863–870 MHz). Various configurations of the passive chip layout (including implementation of guard rings) have been characterized by Direct Power Injection. 3D-PICS electrical performances deduced from two-ports S-parameters are reported, as well as the guard rings efficiency measurements and a compact high frequency model based on S-parameters extraction. Coupling isolation performances of the new integrated PICS components are found satisfactory.
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- 2014
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16. Analytical extraction of the noise sources characteristics of an SiGe HBT
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Daniel Pasquet, Dominique Lesénéchal, and Philippe Descamps
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High impedance ,Noise temperature ,Noise power ,Materials science ,Noise generator ,Acoustics ,Electronic engineering ,Physics::Accelerator Physics ,Y-factor ,Johnson–Nyquist noise ,Flicker noise ,Physics::Classical Physics ,Noise (electronics) - Abstract
After the measurement of the S-parameters and the noise power at the output of an HBT, the impedance matrix and the correlation impedance matrix are calculated. A very simple equivalent circuit is used. All the elements and the noise source characteristics are deduced from these matrices.
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- 2014
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17. Adaptive power supply unit: A solution for efficient 4G macro-cell base station
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Jean-Marie Retrouvey, Philippe Maugars, Nguyen Trieu Luan Le, and Philippe Descamps
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Forward converter ,Power optimizer ,Engineering ,Switched-mode power supply ,business.industry ,Buck converter ,Boost converter ,Electronic engineering ,Ćuk converter ,Electrical engineering ,Power engineering ,Power factor ,business - Abstract
As global consumption of mobile network is increasing, 4G base station must be designed in a context of improvement in power efficiency. This article presents a new concept of managing the DC-to-DC converter supplying power amplifiers in base stations, targeting a factor two reduction in power consumption. This new concepts provide new specifications for base stations but also for DC-DC converter. Details of the concept and the practical implementation of a 500 kHz and zero to 112W buck converter are discussed. Losses are analyzed and dynamic response is discussed. The prototype achieves 94% power efficiency and a good stability over the complete power range.
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- 2014
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18. Adaptive DC-DC converter for 4G macro-cell base station
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Jean-Marie Retrouvey, Philippe Descamps, Philippe Maugars, and Nguyen Trieu Luan Le
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Forward converter ,Power optimizer ,Engineering ,Switched-mode power supply ,Flyback converter ,business.industry ,Buck converter ,Boost converter ,Ćuk converter ,Electrical engineering ,Electronic engineering ,Power factor ,business - Abstract
Despite the constant improvement in power efficiency of macro-cell base stations, the continuous capacity expansion increases considerably the global power consumption of the mobile network. This article presents a new concept of managing the DC-to-DC converter supplying power amplifiers in base stations, targeting a factor two reduction in power consumption. Details of the concept and the practical implementation of a 500 kHz and zero to 112W buck converter are discussed. The prototype achieves 94% power efficiency and a good stability over the complete power range.
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- 2014
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19. Adaptive DC-DC converter for efficient 4G macro-cell base station
- Author
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Jean-Marie Retrouvey, Philippe Maugars, Philippe Descamps, and Nguyen Trieu Luan Le
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Forward converter ,Power optimizer ,Computer science ,business.industry ,Flyback converter ,Buck converter ,Boost converter ,Buck–boost converter ,Ćuk converter ,Electrical engineering ,HVDC converter station ,business - Abstract
This article presents a new problematic in DC-to-DC converter realized for 4G macro cell base station with efficiency improvement concepts. These concepts from EARTH project target a factor two reduction in 4G base station power consumption. The concepts are presented and detailed. DC-to-DC converter specifications needed are discussed. A practical implementation of a 500 kHz and zero to 112W buck converter is presented. The prototype achieves 94% power efficiency and a good stability over the complete power range.
- Published
- 2013
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20. High-Quality varactors and Schottky-Diodes in SiGe:C Technology for mm-Wave and THz applications
- Author
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Olivier Tesson, Laure Rolland du Roscoat, Serge Bardy, Manohiaina Ranaivoniarivo, Laurent Leyssenne, Olivier Doussin, Philippe Descamps, Sidina Wane, and Damienne Bajon
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Voltage-controlled oscillator ,Materials science ,Parasitic capacitance ,business.industry ,Schottky barrier ,Hardware_INTEGRATEDCIRCUITS ,Optoelectronics ,Schottky diode ,Ka band ,Topology (electrical circuits) ,business ,Varicap ,Cutoff frequency - Abstract
This paper presents the design and experimental characterization of High-Quality varactors and Schottky Diodes in SiGe:C Technology. A new layout topology for differential varactor is proposed to significantly improve its quality factor up to the Ka band. This new layout topology addresses the typical trade-off that designers often face between the quality factor and the tuning range. 2x improvement of the quality factor up to 30 GHz over conventional layout topology made of multi fingers is demonstrated. On the other side, special care has been taken to minimize parasitic capacitance between anodes to keep the tuning range stable. Measured VCO with this new type of varactor shows a reduction of 2 dB in the Phase Noise at 1 MHz from the carrier. Silicon-based Schottky Diodes arrays with Cut-Off frequencies in the THz domain are designed and fabricated. Concurrent optimization of Schottky Diode arrays geometry and electrical performances (Cutoff frequency, parasitic, Quality-factor, Sensitivity, Responsiveness, etc.) is carried out based on careful modeling and experimental characterizations. Analysis of the Schottky Diode arrays including sweep in DC-biasing conditions to control non-linearities is studied. Detection mechanisms related to the non-linear behavior are studied and figures of merit are introduced for their analysis.
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- 2013
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21. Design of a K-band wideband controlled variable attenuator for microwave Built-In-Self-Test applications
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Mohamed-Aziz Doukkali, Imene Lahbib, Christophe Kelma, Olivier Tesson, and Philippe Descamps
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Attenuator (electronics) ,Engineering ,business.industry ,Electrical engineering ,Integrated circuit ,law.invention ,Built-in self-test ,law ,K band ,Electronic engineering ,Parasitic extraction ,Wideband ,business ,Monolithic microwave integrated circuit ,Microwave - Abstract
This paper presents a new microwave wideband controlled variable attenuator designed in a BiCMOS process. This variable attenuator is implanted as part of a microwave Built-In-Self-Test (BIST) circuit. The proposed BIST cell is dedicated for direct low cost measurement of the gain and the input 1dB compression point (CP1) of a K-band satellite reception chain (18.2 GHz-22 GHz). The simulation of the controlled variable attenuator with RLCk parasitic extraction shows that it can operate up to 100 GHz with a consumption of 4 mA, an area less than 0.009 mm2 excluding pads and a gain range of 36 dB when the attenuator is alone and 17 dB when it is concatenated to the other blocks. This result was confirmed with the performed measurement on the BIST device. This BIST circuit gives new perspectives in term of test strategy, cost reduction and measurement accuracy for mm-wave integrated circuits.
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- 2013
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22. Calibration for noise parameters measurement with a VNA and without a hot noise source
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Can Qiu, Dominique Lesenechal, Zhong Huang, Daniel Pasquet, and Philippe Descamps
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Noise temperature ,Noise ,Noise measurement ,Noise generator ,Computer science ,Electronic engineering ,Effective input noise temperature ,Y-factor ,Noise figure ,Noise floor - Abstract
The noise parameter measurement needs to be faster and faster. So, we need to use a simple and reliable method. The method that we propose here uses only a network analyzer and few passive impedances placed at the input of the DUT. We describe only the determination of the receiver gain. The determination of the other parameters is more conventional.
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- 2013
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23. Reducing substrate noise coupling in a 3D-PICS integrated passive device by localized P+ guard rings
- Author
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F. Voiron, Dominique Lesenechal, Miled Ben Salah, Philippe Descamps, J. Lefebvre, and Daniel Pasquet
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Guard (information security) ,Engineering ,High resistivity silicon ,Substrate coupling ,Silicon ,business.industry ,Electrical engineering ,chemistry.chemical_element ,Chip ,Integrated circuit layout ,System in package ,chemistry ,Transceiver ,business ,ISM band - Abstract
This paper presents an original concept of a P+ guard ring realized in a 300μm depth High Resistivity Silicon Substrate (HRS) in order to reduce the substrate noise coupling in a 3D-PICS Integrated Passive Device technology. Guard rings have been designed to be a reliable and efficient protection against noise signals propagation. Case study presented in this work illustrates its significant role. In this paper, a 3D-PICS IPD test chip was studied as a first passive part prototype of a System-In-Package chip in combination with RF transceiver operating in the ISM band (863-870 MHz). Various configurations of the passive chip layout (including implementation of guard rings) have been characterized by Direct Power Injection. 3D-PICS electrical performances deduced from two-ports S-parameters are reported, as well as the guard rings efficiency measurements extracted from these S-parameters. Coupling isolation performances of the new integrated PICS components are found satisfactory.
- Published
- 2013
- Full Text
- View/download PDF
24. Reducing substrate noise coupling in a 3D-PICS integrated passive device by localized P+ guard rings
- Author
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F. Voiron, Miled Ben Salah, J. Lefebvre, Dominique Lesenechal, Philippe Descamps, and Daniel Pasquet
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Engineering ,Guard (information security) ,High resistivity silicon ,Materials science ,Silicon ,business.industry ,Electrical engineering ,chemistry.chemical_element ,Chip ,Integrated circuit layout ,System in package ,chemistry ,Optoelectronics ,Transceiver ,business ,ISM band - Abstract
This paper presents an original concept of a P+ guard ring realized in a 300μm depth High Resistivity Silicon Substrate (HRS) in order to reduce the substrate noise coupling in a 3D-PICS Integrated Passive Device technology. Guard rings have been designed to be a reliable and efficient protection against noise signals propagation. Case study presented in this work illustrates its significant role. In this paper, a 3D-PICS IPD test chip was studied as a first passive part prototype of a System-In-Package chip in combination with RF transceiver operating in the ISM band (863-870 MHz). Various configurations of the passive chip layout (including implementation of guard rings) have been characterized by Direct Power Injection. 3D-PICS electrical performances deduced from two-ports S-parameters are reported, as well as the guard rings efficiency measurements extracted from these S-parameters. Coupling isolation performances of the new integrated PICS components are found satisfactory.
- Published
- 2013
- Full Text
- View/download PDF
25. Influence of the output harmonic networks of classes F and F−1 power amplifiers in LINC systems
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Ronald Montesinos, Corinne Berland, Olivier Venard, Philippe Descamps, and Mazen Abi Hussein
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Engineering ,business.industry ,Amplifier ,Transistor ,Transmitter ,Electrical engineering ,law.invention ,Power (physics) ,law ,Modulation ,Harmonics ,Harmonic ,Electronic engineering ,business ,Quadrature amplitude modulation - Abstract
This paper presents the influence of the harmonic networks of class F and inverse F power amplifiers (PAs) in the LINC (LInear amplification using Non-linear Components) transmitter architecture. The analysis and design of these classes with CHIREIX combiner are realised using Agilent ADS software. We use for this work a GaN HEMT transistor from Cree. Performances of the system are evaluated using a 16QAM modulation at 900MHz with 5.63dB Peak-to-Average Power Ratio (PAPR). This study shows the advantages and drawbacks of even/odd harmonics in drain curves of these PA classes as well as the tradeoff linearity-efficiency for the LINC architecture.
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- 2012
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26. Fast and accurate method for flaws localization in stacked die packages from acoustic microscopy echoes transients
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Alban Colder, Patrick Martin, Philippe Descamps, Abdelaziz El Matouat, and Sylvie Legendre
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Reliability (semiconductor) ,Computer science ,business.industry ,Nondestructive testing ,Ball grid array ,Electronic engineering ,Acoustic microscopy ,Microelectronics ,Integrated circuit packaging ,business ,Die (integrated circuit) ,Flip chip - Abstract
The scanning acoustic microscopy (SAM) is widely used today by the manufacturers and researchers in failure analysis labs to improve the microelectronic devices reliability. The goal is to detect and locate flaws inside chips using non destructive test (NDT). New packaging technologies improve the number of layers in a single package using advancing formats including for example flip chip, ball grid array and thereby increasing the number of interfaces to study. This paper deals with the automatic detection of small flaws in the z-axis to reduce time of experiment and facilitate the localization of the flaws especially in solder bump joints and underfill.
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- 2011
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27. Built-In-Self-Test (BIST) probing for wireless non-contact measurement and characterization of integrated circuits and systems
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F. Goulet, Olivier Tesson, Christophe Kelma, Manohiaina Ranaivoniarivo, Bilal Elkassir, Philippe Descamps, Sidina Wane, and Patrice Gamand
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Computer science ,business.industry ,Reconfigurability ,Hardware_PERFORMANCEANDRELIABILITY ,Integrated circuit ,Noise (electronics) ,law.invention ,Phase-locked loop ,Computer Science::Hardware Architecture ,Built-in self-test ,law ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,Wireless ,business ,Telecommunications ,Wireless sensor network ,Electronic circuit - Abstract
This paper discusses concept and feasibility of wireless BIST probing for non-contact measurement and characterization. Inter-Chip noise interferences as function of wireless coupling-path attributes (wireless separation distance between emitter and receiver chips, injected power levels, Charge-Pump-Current) are characterized. Study of BIST for reconfigurability of on-chip functions is investigated based on design of programmable automatic oscillation amplitude control of PLL reference oscillators. Impacts of BIST circuits on system performances are evaluated based on simulation analysis and experimental verifications.
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- 2011
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28. Modelling of an inductor on SiGe: From the measurement to the equivalent scheme
- Author
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Sebastien Quintanel, Philippe Descamps, Dominique Lesenechal, Linh Nguyen-Tran, Daniel Pasquet, Emmanuelle Bourdel, Laboratoire de Microélectronique et de Physique des Semiconducteurs (LaMIPS), Centre National de la Recherche Scientifique (CNRS)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Normandie Université (NU)-Université de Caen Normandie (UNICAEN), Normandie Université (NU)-NXP Semiconductors [France], Equipes Traitement de l'Information et Systèmes (ETIS - UMR 8051), Ecole Nationale Supérieure de l'Electronique et de ses Applications (ENSEA)-Centre National de la Recherche Scientifique (CNRS)-CY Cergy Paris Université (CY), Laboratoire de cristallographie et sciences des matériaux (CRISMAT), Université de Caen Normandie (UNICAEN), Normandie Université (NU)-Normandie Université (NU)-École Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Normandie Université (NU)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS)-Institut de Recherche sur les Matériaux Avancés (IRMA), Normandie Université (NU)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Normandie Université (NU)-Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université de Rouen Normandie (UNIROUEN), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-Université de Caen Normandie (UNICAEN), and Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-NXP Semiconductors [France]-Presto Engineering Europe
- Subjects
Model extraction ,Scheme (programming language) ,Resistance ,Physics::Optics ,Electrical resistance measurement ,Solenoid ,02 engineering and technology ,Passive ,Inductor ,Transmission line measurements ,Ge-Si alloys ,Frequency measurement ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,Inductors ,Inductance ,Spiral inductor ,computer.programming_language ,Physics ,020208 electrical & electronic engineering ,020206 networking & telecommunications ,Physics::Classical Physics ,[SPI.TRON]Engineering Sciences [physics]/Electronics ,Computer Science::Other ,Integrated circuit modeling ,Physics::Accelerator Physics ,computer - Abstract
International audience; We propose a methodology to extract models for inductors from measurements. The methodology is applied to a one-turn solenoid and to spiral inductor.
- Published
- 2011
- Full Text
- View/download PDF
29. Comparative analysis of LINC transmitter performances with class AB and class F power amplifiers
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Ronald Montesinos, Corinne Berland, Philippe Descamps, Olivier Venard, and Mazen Abi Hussein
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Engineering ,Modulation ,business.industry ,Amplifier ,RF power amplifier ,Transmitter ,Electronic engineering ,Linearity ,Topology (electrical circuits) ,business ,Electrical efficiency ,Quadrature amplitude modulation - Abstract
Linear amplification using nonlinear components (LINC) is an architecture that achieves linear power amplification for radio-frequency (RF) transmitters. This paper presents an analysis of the sizing of a Chireix coupler used in this architecture. The objective here is to find the optimum combiner topology so that the best compromise between power efficiency and linearity can be achieved. As this compromise depends on the class of the power amplifier (PA) we focused our work, for this study, on an overdriven class − AB PA and a class − F PA. Both transmitters are evaluated using a 16QAM digital modulation.
- Published
- 2011
- Full Text
- View/download PDF
30. New measurement method for two-port noise parameters
- Author
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Dominique Lesenechal, Philippe Descamps, C. Andrei, and Daniel Pasquet
- Subjects
Physics ,Noise temperature ,Noise generator ,Noise measurement ,Acoustics ,Noise spectral density ,Mathematical analysis ,Effective input noise temperature ,Y-factor ,Noise figure ,Noise (electronics) - Abstract
The noise parameters are useful for the design of low noise amplifiers. They are usually deducted by the measurement of the noise figure that varies with the impedance presented at the input as in Eq. 1. F= F MIN + R N over ∜ Y S |Y S − Y OPT |2 (1) where Y S is the admittance presented at the input and Y OPT is the admittance for which the noise figure has its lower value F MIN . R N is the noise resistance that characterizes the sensitivity to the variation of the impedance. Many optimization methods [1] have been developed in order to reach F MIN , R N and Y OPT from many measurement points.
- Published
- 2010
- Full Text
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31. An equivalent circuit model for simulation of the ggNMOS transient triggering under ESD operating conditions
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L. A. Coyitangiye, H. Murray, Aziz Doukkali, Richard Grisel, F. Barbier, and Philippe Descamps
- Subjects
Engineering ,Electrostatic discharge ,CMOS ,business.industry ,Electronic engineering ,Equivalent circuit ,ggNMOS ,Transient (oscillation) ,business ,NMOS logic ,Transmission-line pulse ,Electronic circuit - Abstract
A new equivalent circuit suitable for transient simulation methodology of Gate-Grounded NMOS transistor (ggNMOS) used in Electrostatic Discharge (ESD) protection circuits is proposed in this paper. The target technology is a classical CMOS 0.25 μm. This model, contrary to classical I-V static model, is intended to cover the dynamic comportment of the ggNMOS during all the phases of the Transmission Line Pulse (TLP) stress tests. Starting from experimental TLP measures concerning the transient ggNMOS triggering, it is demonstrated that the modeling can be based on a classical equivalent circuit. The parameters extraction methodology for the model, relied to the physical structure of the component is also presented. Finally, simulation results are presented and compared with experimental data. The model is then correlated to the simplified physical structure of the device. By example for a ggNMOS W/L=3D50μm/0.5μm the transient characteristics for TLP current of 0.3 and 0.7A created by simulating the model are the same as the one measured on the TLP tester thus validating the model.
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- 2009
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32. Removing S-parameters on-wafer measurements parasitic elements using time domain gating: Application to transmission lines
- Author
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Olivier Hubert, Philippe Descamps, Patrick Poirier, and Dolphin Abessolo-Bidzo
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Engineering ,Electric power transmission ,business.industry ,Hardware_INTEGRATEDCIRCUITS ,Electronic engineering ,Wafer ,Bicmos integrated circuits ,Hardware_PERFORMANCEANDRELIABILITY ,Time domain gating ,business ,Bicmos technology ,Microwave - Abstract
This paper presents experimental results of removing on-wafer microwave measurements parasitic elements due to RF probes pads and interconnects using Time Domain Gating method up to 110GHz. This approach has been tested on transmission lines processed using metallization layers of NXP RF BiCMOS technology and compared with the classical OPEN/SHORT de-embedding method. The limitations and the ways to improve this technique are shown.
- Published
- 2006
- Full Text
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33. 17 MeV to 200 MeV protons Irradiation to characterize CCD's sensitivity to Single Event Transient
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S. Barde, P. Calvel, Laurent Dusseau, Philippe Descamps, G. Rolland, and Rosine Coq Germanicus
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Physics ,Physics::Instrumentation and Detectors ,Nuclear Theory ,Physics::Medical Physics ,Signal ,Ionizing radiation ,Transient noise ,Physics::Accelerator Physics ,Particle ,Transient (oscillation) ,Irradiation ,Atomic physics ,Nuclear Experiment ,Event (particle physics) ,Dark current - Abstract
Experimental data obtained during irradiations of a COTS (commercial off the shelf) CCD are presented. Monoenergetic protons from 17 MeV to 200 MeV are used. We studied transient noise induced by the localized ionizing of the particle. The SET (single effect transient) is measured during irradiation. We report on the irradiation experiments. The evolution of the generated signal versus protons LET is linear.
- Published
- 2005
- Full Text
- View/download PDF
34. Failure localization in IC packages using time domain reflectometry: technique limitations and possible improvements
- Author
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Patrick Poirier, Philippe Descamps, Bernadette Domengès, and Dolphin Abessolo-Bidzo
- Subjects
Engineering ,business.industry ,Bandwidth (signal processing) ,Electronic engineering ,Electrical engineering ,Integrated circuit packaging ,Time domain ,business ,Reflectometry - Abstract
Our case study has shown the efficiency of isolating failing sites (shorts, opens) in IC packages using TDR and especially sequential comparative TDR analysis, which allowed to overcome some of TDR hardware limitations and to identify the different regions of the DUT. Currently, it's possible to increase the bandwidth of the main standard TDR sources available on the market up to 70 GHz, but the main limitation is due to TDR probes which best bandwidth only reaches 20 GHz. Anyway, TDR technique has already proved to definitively take up its own place in the non-destructive failure analysis flow of FA labs beside SCAT and x-ray ones for most of common IC packages used in semiconductors industry.
- Published
- 2005
- Full Text
- View/download PDF
35. Magnetic microscopy for ICs failure analysis : comparative case studies using SQUID, GMR and MTJ systems
- Author
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Philippe Descamps, P. Poirier, and Olivier Crepel
- Subjects
SQUID ,Materials science ,business.industry ,Scanning SQUID microscopy ,law ,Microscopy ,Electrical engineering ,Electronic engineering ,Giant magnetoresistance ,business ,Electronic circuit ,Magnetic field ,law.invention - Abstract
Magnetic field based techniques have shown great capabilities for investigation of current flows in ICs. After reviewing the performances of SQUID, GMR (hard disk head technologies) and MTJ existing sensors, we present results obtained on various case studies. This comparison shows the benefit of each approach according to each case study (packaged devices, flip-chip circuits,...). Finally we discuss the obtained results to classify current techniques, optimal domain of applications and advantages.
- Published
- 2004
- Full Text
- View/download PDF
36. Chip-Package-PCB Co-Design of Power Combiners in SESUB and WLCSP Technology with Re-Distribution Layers
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Laurent Leyssenne, Thanh Vinh Dinh, Dominique Lesenechal, Damienne Baion, Philippe Descamps, and Sidina Wane
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020208 electrical & electronic engineering ,020206 networking & telecommunications ,Topology (electrical circuits) ,Hardware_PERFORMANCEANDRELIABILITY ,02 engineering and technology ,Inductor ,Chip ,7. Clean energy ,Chip-scale package ,Broadband ,Hardware_INTEGRATEDCIRCUITS ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,RLC circuit ,Power dividers and directional couplers ,Equivalent circuit - Abstract
We present SESUB (Semiconductor Embedded in Substrate) and WLCSP (Wafer-Level-Chip-Scale Packaging) integration of Power Combiners for WLAN and 5G applications. The proposed technology solutions offer optimized Electromagnetic-Thermal-Mechanical performances for Energy-Efficient Chip-Package-PCB distributed Co-Design. PDK-Library oriented RLC Lumped-model topologies are compared to broadband distributed Layout design. Prototype demonstrators are designed and experimentally verified for emerging 5G and IoT applications both for frequencies below 6GHz and in the mm-Wave domain (28GHz, 39GHz). Innovative broadband physics-based RLC equivalent circuit models valid from DC to mm-Wave frequencies is proposed and verified against measurement.
- Full Text
- View/download PDF
37. Hybrid Static-Dynamic Modeling and Experimental Analysis of Multi-Scale Complex Environments: Application to Ubiquitous Interactions
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Peter Russer, Johannes A. Russer, Philippe Descamps, Gabriele Gradoni, Sidina Wane, and Damienne Bajon
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Computer science ,business.industry ,Emerging technologies ,Distributed computing ,MIMO ,020206 networking & telecommunications ,020207 software engineering ,Advanced driver assistance systems ,02 engineering and technology ,Optical coupling ,System dynamics ,0202 electrical engineering, electronic engineering, information engineering ,RFIC ,Wireless ,business ,Agile software development - Abstract
Hybridization of agile mm-Wave MIMO and Phased-Array technologies with static (Capacitive-Resistive-Inductive effects) and dynamic multi-physics (coupled ultrasonic and optical waves) sensing solutions is proposed toward new functionalities for environmental perceptions and ubiquitous interactions. The resulting paradigms will operate the unification of Contact-driven actions and contactless Gesture-driven interactions for enabling emerging technologies relative to interactions of humans with smart devices and systems in randomly changing environments. Perspectives for Autonomous Vehicles with Advanced Driver Assistance Systems (ADAS) including Gesture-Recognition (GR) through ubiquitous interactions based on hybrid agile mm-Wave RFIC technologies and optical systems are drawn.
- Full Text
- View/download PDF
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