31 results on '"Rodgers, M."'
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2. A new methodology for solving multi-objective stochastic optimization problems with independent objective functions
3. Effective Schottky Barrier Height modulation using dielectric dipoles for source/drain specific contact resistivity improvement
4. Exploring tactical interaction between dynamic airspace configuration and traffic flow management (DAC-TFM)
5. FinFET parasitic resistance reduction by segregating shallow Sb, Ge and As implants at the silicide interface
6. Application of cluster Ion (carbon) implantation for strain applications
7. Performance and variability in multi-VT FinFETs using fin doping
8. Simple FinFET gate doping technique for dipole-engineered Vt tuning and CET scaling
9. Impact of thermal budget on dopant-segregated (DS) metal S/D gate-all-around (GAA) PFETs
10. Advanced contact and junction technologies for improved parasitic resistance and short channel immunity in FinFETs beyond 22nm node
11. 300mm FinFET results utilizing conformal, damage free, ultra shallow junctions (Xj∼5nm) formed with molecular monolayer doping technique
12. Plasma doping of silicon fin structures
13. Strained SiGe and Si FinFETs for high performance logic with SiGe/Si stack on SOI
14. Enhanced performance in SOI FinFETs with low series resistance by aluminum implant as a solution beyond 22nm node
15. Plasma doping of silicon fin structures.
16. Detecting intra-word faults in word-oriented memories.
17. March SL: a test for all static linked memory faults.
18. March SS: a test for all static simple RAM faults.
19. Realistic fault models and test procedure for multi-port SRAMs.
20. Detecting unique faults in multi-port SRAMs.
21. March tests for realistic faults in two-port memories.
22. Test challenges for deep sub-micron technologies.
23. Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors.
24. Monitoring Fecal Contamination of Marine Waters by Measuring C. Perfringens Spores in the Sediments.
25. Effects of Water on the Aging and Radiation Response of MOS Devices.
26. The Effects of Aging on MOS Irradiation and Annealing Response.
27. The Production of Molecular Excited States by Pulsed Electron Beams.
28. Detecting unique faults in multi-port SRAMs
29. Characterization of sub-nm AlOx and LaOx capping layers on high-k gate stack film systems using VuV (λ=120 nm) reflectivity.
30. 300mm FinFET results utilizing conformal, damage free, ultra shallow junctions (Xj∼5nm) formed with molecular monolayer doping technique.
31. Session Abstract.
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