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12. Comparison of advanced transport models for nanoscale MOSFETs, 10th International Conference on Ultimate Integration of Silicon

13. Experimental and theoretical investigation of the ‘apparent’ mobility degradation in Bulk and UTBB-FDSOI devices: A focus on the near-spacer-region resistance

14. Mobility in high-K metal gate UTBB-FDSOI devices: From NEGF to TCAD perspectives

18. Drain current computation in nanoscale nMOSFETs: Comparison of transport models

19. Comparison of advanced transport models for nanoscale nMOSFETs

27. Cloud Desktop Workload: A Characterization Study

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