1. A Refined Selected-Codes Linearity Test on Pipelined ADC
- Author
-
I-Chun Tsai, Fang-Ru Liu, Jianhua Feng, and Hongfei Ye
- Subjects
Offset (computer science) ,Linearity test ,Comparator ,Computer science ,Static testing ,Test method ,Hardware_ARITHMETICANDLOGICSTRUCTURES ,Transition edge ,Capacitance ,Algorithm ,Test data - Abstract
A refined selected-codes based test method for pipelined ADC is presented. By selecting a set of specific codes and a self-correction mechanism implementation, the proposed method leverages the redundancy characteristic of the Pipelined ADC to reduce the number of output codes in linearity test after a comprehensive consideration of the comparator offset, capacitance mismatch, gain error, and input noise. Experimental evaluation on a 10-bit 1.5-bit/stage Pipelined ADC as test model has proved that the test data has decreased to 7% compared to the traditional method while maintaining a level of accuracy by minimizing the error of mapping between the comparator and the transition edge. The proposed method efficiently decrease the test cost and heightening the test accuracy.
- Published
- 2019
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