Search

We propose a graph-based modulation format identification (MFI) scheme for elastic optical network (EON), which exploits the trajectory information of the adjacent received symbols to identify six commonly-used modulation formats signals. A uniform grid is constructed in the first quadrant of two-dimensional (2D) Stokes plane to capture the received symbols sequence, and then the corresponding trajectory information is converted into the adjacent matrix via graph theory. The eigenvector associated with the largest eigenvalue of the adjacent matrix is selected as the discriminated-feature of the corresponding modulation format signal. Subsequently, we employ cosine similarity algorithm to obtain the modulation format of the unknown signal by analyzing the angle between the discriminated-features of the canonical modulation formats signals and the unknown signal. Then, the effectiveness of the proposed MFI scheme is verified through 28 GBaud polarization division multiplexing (PDM)-binary phase shift keying (BPSK), PDM-quadrature phase shift keying (QPSK), PDM-8 quadrature amplitude modulation (QAM), PDM-16QAM, PDM-32QAM, and PDM-64QAM simulation systems. The simulation results show that the proposed MFI scheme achieves well performance on the required minimum optical signal-to-noise ratio (OSNR) value, the robustness to the variation of the transmission environment, residual chromatic dispersion (CD) and different group delay (DGD). Finally, the proposed MFI scheme is further verified by 20 GBaud PDM-QPSK/8QAM/-16QAM/-32QAM long-haul transmission experiments, and the results demonstrate that the proposed MFI scheme exhibits good resilience towards fiber nonlinear impairments. [ABSTRACT FROM AUTHOR]

Graphics Processing Units (GPUs) have rapidly evolved to enable energy-efficient data-parallel computing for a broad range of scientific areas. While GPUs achieve exascale performance at a stringent power budget, they are also susceptible to soft errors, often caused by high-energy particle strikes, that can significantly affect the application output quality. Understanding the resilience of general purpose GPU (GPGPU) applications is especially challenging because unlike CPU applications, which are mostly single-threaded, GPGPU applications can contain hundreds to thousands of threads, resulting in a tremendously large fault site space in the order of billions, even for some simple applications and even when considering the occurrence of just a single-bit fault. We present a systematic way to progressively prune the fault site space aiming to dramatically reduce the number of fault injections such that assessment for GPGPU application error resilience becomes practical. The key insight behind our proposed methodology stems from the fact that while GPGPU applications spawn a lot of threads, many of them execute the same set of instructions. Therefore, several fault sites are redundant and can be pruned by careful analysis. We identify important features across a set of 10 applications (16 kernels) from Rodinia and Polybench suites and conclude that threads can be primarily classified based on the number of the dynamic instructions they execute. We therefore achieve significant fault site reduction by analyzing only a small subset of threads that are representative of the dynamic instruction behavior (and therefore error resilience behavior) of the GPGPU applications. Further pruning is achieved by identifying the dynamic instruction commonalities (and differences) across code blocks within this representative set of threads, a subset of loop iterations within the representative threads, and a subset of destination register bit positions. The above steps result in a tremendous reduction of fault sites by up to seven orders of magnitude. Yet, this reduced fault site space accurately captures the error resilience profile of GPGPU applications. We show the effectiveness of the proposed progressive pruning technique for a single-bit model and illustrate its application to even more challenging cases with three distinct multi-bit fault models. [ABSTRACT FROM AUTHOR]