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13 results on '"hot carrier degradation (HCD)"'

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1. Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions.

2. Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In 2 O 3 Thin-Film Transistors.

3. An Analytical Model of Hot Carrier Degradation in LDMOS Transistors: Rediscovery of Universal Scaling.

4. Localizing Hot-Carrier Degradation in Silicon Trench MOSFETs.

5. Comparative Analysis of Hot Carrier Degradation (HCD) in 10-nm Node nMOS/pMOS FinFET Devices.

6. Investigation of the Temperature Dependence of Hot-Carrier Degradation in Si MOSFETs Using Spectroscopic Charge Pumping.

7. On-Chip Over-Voltage Protection Design Against Surge Events on the CC Pin of USB Type-C Interface.

8. A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review.

9. Modeling of HCD Kinetics for Full ${V}_{{G}}$ / ${V}_{{D}}$ Span in the Presence of NBTI, Electron Trapping, and Self Heating in RMG SiGe p-FinFETs.

10. On the Universality of Hot Carrier Degradation: Multiple Probes, Various Operating Regimes, and Different MOSFET Architectures.

11. A BSIM-Based Predictive Hot-Carrier Aging Compact Model

12. Investigation of Self-Heating Effect on Hot Carrier Degradation in Multiple-Fin SOI FinFETs.

13. Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures

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