1. Measuring nanoNewton forces with an indigenous atomic force microscope.
- Author
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Singha, Achintya, Roy, Anushree, Sonkusare, Anil, Kumar, Pradeep, and Kaul, A. D.
- Subjects
- *
ATOMIC force microscopy , *MAGNETIC fields , *ATOMS , *NANOSCIENCE , *NEAR-field microscopy - Abstract
The Atomic Force Microscope (AFM) is a versatile tool in experimental research. The principle of operation of the AFM is based on the measurement of force fields between an atomically sharp tip and surface atoms of metals or insulators. In this note, we demonstrate the ability and limitation of an indigenous AFM, designed and fabricated by us, for various measurements. In particular, short- and long-range interactions between two surfaces, of different geometrical configurations, have been measured and analysed. Our results indicate the reliability of our instrument for measuring forces in the nanonewton scale. [ABSTRACT FROM AUTHOR]
- Published
- 2007