1. Simulation and Experimental Study of Wavefront Measurement Accuracy of the Pencil-Beam Method
- Author
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Takumi Goto, Makina Yabashi, Hiroki Nakamori, Kazuto Yamauchi, Satoshi Matsuyama, Yoshiki Kohmura, Yasuhisa Sano, and Tetsuya Ishikawa
- Subjects
Wavefront ,Nuclear and High Energy Physics ,Accuracy and precision ,Materials science ,business.industry ,Free-electron laser ,Synchrotron radiation ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Atomic and Molecular Physics, and Optics ,010309 optics ,Optics ,Machining ,0103 physical sciences ,0210 nano-technology ,business - Abstract
Ultra-bright and high-coherence X-rays are now being used in synchrotron radiation facilities and X-ray free electron laser facilities. X-ray focusing techniques are essential to take full advantage of these excellent X-ray light sources. To meet the strong demand, high-quality X-ray focusing optics have been developed owing to the advancement of ultraprecision machining and measurement. State-of-the-art refractive lenses [1], zone plates [2], and Laue lenses [3] can be used to achieve X-ray focusing to a spot a few tens of nanometers.
- Published
- 2016
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