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Your search keyword '"Buonanno, Giacomo"' showing total 2 results
Start Over Author "Buonanno, Giacomo" Publisher institute of electrical and electronics engineers, inc.
2 results on '"Buonanno, Giacomo"'

1. A wafer level testability approach based on an improved scan insertion technique

Author

Bolchini, Cristiana, Buonanno, Giacomo, Ferrandi, Fabrizio, Sciuto, Donatella, Bombana, Massimo, and Cavalloro, Patrizia

Subjects
Integrated circuits -- Wafer-scale integration, Fault tolerance (Computers) -- Testing, Business, Engineering and manufacturing industries, Science and technology
Abstract

A structured approach to design testable wafer scale devices using the Partial Scan Methodology provides most suitable solutions with respect to performance and overhead assuring Bare die testability, while module testability is realized through Boundary Scan technique. An application to the Item Processor of the Vending Machine for observing Testability Assistant performance is discussed.

Published
1995

2. Innovative structures for CMOS combinational gates synthesis

Author

Buonanno, Giacomo, Sciuto, Donatella, and Stefanelli, Renato

Subjects
Scientific Research, Programmable Logic Array, Circuit Design, New Technique, Algorithm Analysis, Combinational Circuits, Programmable logic devices, CMOS, Gate arrays, Algorithms -- Analysis, Programmable logic devices -- Innovations, Complementary metal oxide semiconductors -- Design and construction, Gate arrays -- Design and construction
Published
1994

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