10 results on '"Eneman, Geert"'
Search Results
2. Reliability of strained-Si devices with post-oxide-deposition strain introduction
3. Gate influence on the layout sensitivity of [Si. Sub. 1-x] [Ge.sub.x] S/D [Si.sub.1-y] [C.sub.y] S/D transistors including an analytical model
4. Impact of donor concentration, electric field, and temperature effects on the leakage current in germanium p+/n junctions
5. Insight into the aggravated lifetime reliability in advanced MOSFETs with strained-Si channels on SiGe strain-relaxed buffers due to self-heating
6. High-performance deep submicron Ge pMOSFETs with halo implants
7. Scalability of stress induced by contact-etch-stop layers: A simulation study
8. Performance and reliability of strained-silicon nMOSFETs with SiN cap layer
9. Scalability of the [Si.sub.1-x][Ge.sub.x] source/drain technology for the 45-nm technology node and beyond
10. Processing aspects in the low-frequency noise of nMOSFETs on strained-silicon substrates
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.