7 results on '"Iannuzzo, F."'
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2. Analysis of Heavy Ion Irradiation Induced Thermal Damage in SiC Schottky Diodes
3. Single-Event Effects in Power MOSFETs During Heavy Ion Irradiations Performed After Gamma-Ray Degradation
4. Race-Control Algorithm for the Full-Bridge PRCP Converter Using Cost-Effective FPGAs
5. Physical CAD Model for High-Voltage IGBTs Based on Lumped-Charge Approach
6. Measurement of the BJT activation current during the reverse recovery of power MOSFET's drain-source diode
7. Experimental and numerical investigation on MOSFET's failure during reverse recovery of its internal diode
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