28 results on '"Sierawski, Brian D."'
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2. Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors
3. Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors
4. Sensitive-Volume Model of Single-Event Latchup for a 180-nm SRAM Test Structure
5. Inclusion of Radiation Environment Variability for Reliability Estimates for SiC Power MOSFETs
6. The Impact of Proton-Induced Single Events on Image Classification in a Neuromorphic Computing Architecture
7. Radiation Response and Adaptive Control-Based Degradation Mitigation of MEMS Accelerometers in Ionizing Dose Environments
8. CubeSats and Crowd-Sourced Monitoring for Single Event Effects Hardness Assurance
9. Bayesian Inference Modeling of Total Ionizing Dose Effects on System Performance
10. Effects of Energy-Deposition Variability on Soft Error Rate Prediction
11. Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code
12. System Health Awareness in Total-Ionizing Dose Environments
13. Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers
14. The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets
15. Dose Enhancement and Reduction in SiO$_{2}$ and High-$\kappa$ MOS Insulators
16. Muon-Induced Single Event Upsets in Deep-Submicron Technology
17. Contribution of Control Logic Upsets and Multi-Node Charge Collection to Flip-Flop SEU Cross-Section in 40-nm CMOS
18. Heavy Ion Testing With Iron at 1 GeV/amu
19. Monte Carlo Simulation of Single Event Effects
20. General Framework for Single Event Effects Rate Prediction in Microelectronics
21. Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions
22. Effects of Surrounding Materials on Proton-Induced Energy Deposition in Large Silicon Diode Arrays
23. A Generalized SiGe HBT Single-Event Effects Model for On-Orbit Event Rate Calculations
24. Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch
25. Distribution of Proton-Induced Transients in Silicon Focal Plane Arrays
26. Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM
27. Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools
28. Reducing Soft Error Rate in Logic Circuits Through Approximate Logic Functions
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