16 results on '"Yulin Gao"'
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2. Remote Online Two-Step Stress Lifetime Acceleration Test System for Ultraviolet Light-Emitting Diodes
- Author
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Qiu-Wei Zheng, Yulin Gao, Zhong Chen, Yijun Lu, Tingzhu Wu, Ziquan Guo, Lihong Zhu, Yu-Jiao Ruan, Yue Lin, and Weijie Guo
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Optical fiber ,Materials science ,business.industry ,Photoelectric effect ,medicine.disease_cause ,law.invention ,Acceleration ,law ,medicine ,Optoelectronics ,Junction temperature ,Electrical and Electronic Engineering ,business ,Instrumentation ,Remote control ,Ultraviolet ,Light-emitting diode ,Diode - Abstract
Ultraviolet light-emitting diodes (UV LEDs) have been widely applied in various fields, such as sewage treatment, sterilization, and disinfection medical treatment. However, the remained problems of UV LEDs mainly concern poor photoelectric stability, low efficiency, safety protection, and among others. In order to evaluate and predict the stability and lifetime of UV LEDs safely and efficiently, a comprehensive UV LEDs two-step aging test system has been designed in this work. Two steps of different temperature stresses with total aging time up to 720 h are applied to UV LEDs. The junction temperature derived from spectroscopy has been taken under consideration during the test to evaluate lifetime accurately. A smartphone-based remote control and test scheme has been developed to monitor and control the online testing and therefore ensure the safety and convenience during the aging experiment. more...
- Published
- 2021
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3. Multichannel Optical Fiber Spectral and Imaging System for Pixel-Level Measurement of Display
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Yulin Gao, Yi-Cheng Zheng, Lili Zheng, Tingzhu Wu, Shu-Lian Jiang, Yue Lin, Ziquan Guo, Xi-Long Li, Yu-Jiao Ruan, Yijun Lu, Zhong Chen, and Lihong Zhu
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Optical fiber ,Pixel ,Spectrometer ,business.industry ,Computer science ,02 engineering and technology ,Photometer ,Laser ,Multiplexer ,Atomic and Molecular Physics, and Optics ,Electronic, Optical and Magnetic Materials ,law.invention ,020210 optoelectronics & photonics ,Optics ,Optical path ,law ,visual_art ,0202 electrical engineering, electronic engineering, information engineering ,visual_art.visual_art_medium ,Electrical and Electronic Engineering ,business ,LED display - Abstract
This letter proposes a multichannel optical fiber spectral and imaging system, aiming at evaluating the pixel-level optical properties of high definition display efficiently and precisely. The system makes use of 16-channel optical fibers to form a detecting array so that 16 points of a display under test can be measured cyclically by multiplexer and spectrometer and monitored by camera simultaneously. The optical path is reversible for both the light source and the laser positioning, and adjustable along a rail driven by a motor to enable the system to work in either magnification mode or reduction mode. The feasibility and accuracy of the system are verified by comparative experiments of standard light source, LED display, and OLED display, identifying both merits of a single-spot spectroradiometer and an imaging photometer/colorimeter and even more functions like pitch size and color gamut. more...
- Published
- 2020
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4. Determining Phosphor Temperature in Light-Emitting Diode Based on Divisional Normalized Emission Power
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Lin Yi, Yulin Gao, Shuo-Di Lei, Jie Chen, Pin-Chun Kang, Yu-Jiao Ruan, Chen Guolong, Lihong Zhu, Zhi-Hui Li, Jia-En Huang, Zhong Chen, Ziquan Guo, Yijun Lu, Yang Gao, and Chen Yang
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010302 applied physics ,Emission power ,Materials science ,business.industry ,Phosphor ,01 natural sciences ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,law.invention ,chemistry.chemical_compound ,Silicone ,chemistry ,law ,0103 physical sciences ,Thermal ,Calibration ,Optoelectronics ,Electrical and Electronic Engineering ,business ,Diode ,Light-emitting diode - Abstract
We propose a non-contact method for determining phosphor/silicone temperature (phosphor temperature) in phosphor-coated light-emitting diode (pc-LED). The pc-LED with a surface mounted device (SMD) structure is primarily consisted of InGaN/GaN blue LED chip, (Sr,Ca)AlSiN3:Eu2+ red rare-earth phosphor, and transparent dimethyl silicone. This proposed method is basically based on a linear temperature dependence of divisional normalized emission power for phosphor/silicone mixture. Four types of pc-LED corresponding to four different phosphor concentrations are examined by proposed method. A comparison of measured results between micro-thermocouple device and proposed method has also been carried out, showing a fairly good agreement between them, except for pc-LED with 4.8 wt% phosphor concentration. We suggest that this proposed method can provide a useful tool for further study of optical and thermal characteristics in pc-LED. more...
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- 2019
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5. A Microscopic Hyperspectral-Based Centroid Wavelength Method for Measuring Two-Dimensional Junction Temperature Distribution of LEDs
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Chen Guolong, Yang Gao, Yijun Lu, Ziquan Guo, Yulin Gao, Yu-Jiao Ruan, Lihong Zhu, Jian Jin, Zhong Chen, and Yue Lin
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010302 applied physics ,Materials science ,business.industry ,Centroid ,Hyperspectral imaging ,01 natural sciences ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,law.invention ,Matrix (mathematics) ,Wavelength ,Optics ,law ,0103 physical sciences ,Junction temperature ,Electrical and Electronic Engineering ,business ,Diode ,Light-emitting diode - Abstract
In this letter, we propose an experimental method for determining two-dimensional (2D) junction temperature distribution of light-emitting diodes (LEDs) using microscopic hyperspectral-based centroid wavelength. The 2D centroid wavelength matrix is extracted from the hyperspectral data cube as temperature sensitive optical parameters (TSOP), which is linearly calibrated by short pulse voltage signal in order to eliminate the influence of self-heating effect. The 2D junction-temperature distributions of LEDs under working conditions are derived by TSOP matrix. The comparative experiments by micro-thermocouple ( $\mu $ -TC) and IR imaging reveal good coincidence in both averaged temperature and temperature distribution trends. more...
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- 2019
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6. Research on a Camera-Based Microscopic Imaging System to Inspect the Surface Luminance of the Micro-LED Array
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Wei Yan, Yue Lin, Hao-Chung Kuo, Yulin Gao, Tingzhu Wu, Zhong Chen, Lili Zheng, Lihong Zhu, Ziquan Guo, and Yijun Lu
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Brightness ,Microscope ,General Computer Science ,Computer science ,business.industry ,inspection system ,luminance measurement ,General Engineering ,02 engineering and technology ,3D luminance distribution ,Luminance ,law.invention ,Lens (optics) ,Digital image ,020210 optoelectronics & photonics ,Optics ,law ,microscope with camera ,0202 electrical engineering, electronic engineering, information engineering ,General Materials Science ,lcsh:Electrical engineering. Electronics. Nuclear engineering ,business ,lcsh:TK1-9971 ,Micro-LED ,Light-emitting diode - Abstract
A majority of luminance measurement systems are currently focused on measuring the total luminance of light-emitting diodes (LEDs). It has largely limit its application on micro-LEDs, which require capturing the microscopic surface luminance. In order to study the microscopic characteristics of micro-LED displays, in this paper we propose a practical method that can accurately measure the luminance of a whole micro-LED array and even the surface luminance distribution of any single micro-led chip on the array. The essentials of this method are a high-precision complementary metal oxide semiconductor camera and a self-made data processing algorithm. Results show that the maximum error of the luminance measurement is less than 8%, which can prove the accuracy of the method. The metrical wavelength range and the accuracy of system can be dynamically set according to the camera and microscope. Endowed with ultrahigh dynamic ranges, this system proves its competency for evaluating the spatially resolved distribution of luminance for high brightness micro-LEDs. more...
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- 2018
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7. Efficient Measurement of Thermal Coupling Effects on Multichip Light-Emitting Diodes
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Yulin Gao, Ziquan Guo, Zhong Chen, Yue Lin, Yijun Lu, Chen Guolong, Lihong Zhu, Tong Liu, and Hongli Lu
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010302 applied physics ,Materials science ,business.industry ,Infrared ,020208 electrical & electronic engineering ,Hardware_PERFORMANCEANDRELIABILITY ,02 engineering and technology ,Chip ,01 natural sciences ,Temperature measurement ,law.invention ,law ,0103 physical sciences ,Thermography ,Thermal ,Hardware_INTEGRATEDCIRCUITS ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,Optoelectronics ,Transient (oscillation) ,Electrical and Electronic Engineering ,business ,Diode ,Light-emitting diode - Abstract
With the emerging market for multichip module based high-power LED systems, the demand for advanced thermal management techniques has been steadily growing. This paper presents a model developed by the authors for thermal coupling matrix that can calculate temperature distribution at a given heat power of each chip. The model significantly simplifies the task of measuring thermal coupling effect on multichip light-emitting diodes with symmetrical structure, while simultaneously preserving temperature accuracy. The modeling technique was validated experimentally on three-, four-, and six-chip rectangular modules, and a ten-chip circular module, by infrared thermography and transient thermal measuring system, respectively. The modeling technique was found to be more efficient especially for large systems. The model offers a rapid way to predict thermal coupling behaviors of multichip LED systems. more...
- Published
- 2017
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8. A Bipolar-Pulse Voltage Method for Junction Temperature Measurement of Alternating Current Light-Emitting Diodes
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Yijun Lu, Yi Tu, Ziquan Guo, Lihong Zhu, Yue Lin, Yulin Gao, Tingzhu Wu, Honghui Zhu, Xiao Jingjing, and Zhong Chen
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010302 applied physics ,Materials science ,business.industry ,Thermal resistance ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Temperature measurement ,Thermal management of high-power LEDs ,Electronic, Optical and Magnetic Materials ,law.invention ,Amplitude ,law ,Thermocouple ,0103 physical sciences ,Optoelectronics ,Junction temperature ,Electrical and Electronic Engineering ,0210 nano-technology ,Alternating current ,business ,Diode - Abstract
We introduce a new method for measuring the junction temperature of alternating current light-emitting diodes. This method employs a periodic bipolar voltage pulse signal as the input, and utilizes the amplitude of corresponding output current as the temperature sensitive parameter (TSP), of which a linear temperature dependence is proven in a prior experiment in this paper. On the basis of the TSP, we devise a detailed procedure—first, measure the thermal resistance of the package of ac-LEDs, which further contributes to the calculation of junction temperatures under various power inputs. Comparisons between values calculated by using this method and those obtained directly from a thermocouple indicate a decent accuracy of the former. The advantage of this method benefits from the stability of thermal resistance under different driving conditions that one could immediately obtain the junction temperature by measuring the electric and optical powers. more...
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- 2017
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9. Determining Junction Temperature of LEDs by the Relative Reflected Intensity of the Incident Exciting Light
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Yao Xiao, Lihong Zhu, Yulin Gao, Yijun Lu, Ziquan Guo, Tingzhu Wu, Sijia Dang, Yue Lin, and Zhong Chen
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010302 applied physics ,Optical fiber ,Materials science ,business.industry ,Light extraction in LEDs ,Dynamic range ,020208 electrical & electronic engineering ,02 engineering and technology ,01 natural sciences ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,law.invention ,Optics ,law ,0103 physical sciences ,0202 electrical engineering, electronic engineering, information engineering ,Optoelectronics ,Junction temperature ,Electrical and Electronic Engineering ,business ,Absorption (electromagnetic radiation) ,Diode ,Light-emitting diode - Abstract
Relative reflected intensity of the incident exciting light is proposed to measure the junction temperature of light-emitting diodes (LEDs) under test. Reflectance spectra at a wide junction temperature range are acquired. Multichannel optical fibers greatly increase the collecting efficiency of the reflected light. Lock-in technique is utilized to exclude the interference of the emitting light from LEDs under test and to increase the dynamic range greatly. The results are in good agreement with those directly tested by a microthermocouple. To avoid extra carrier absorption and modulation effect, the incident exciting light should harbor smaller bandgap than that of LEDs under test. more...
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- 2017
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10. Determining Junction Temperature in InGaN Light-Emitting Diodes Using Low Forward Currents
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Ziquan Guo, Yulin Gao, Chen Guolong, Tien-Mo Shih, Biqing Wu, Lihong Zhu, Richard Ru-Gin Chang, Yijun Lu, Zhong Chen, Si-Qi Lin, Xian-Guang Fan, and Jihong Zhang
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Materials science ,business.industry ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,law.invention ,Optics ,law ,Thermal ,Calibration ,Optoelectronics ,Junction temperature ,Electrical and Electronic Engineering ,business ,Diode ,Voltage ,Parametric statistics ,Light-emitting diode - Abstract
We propose an experimental method that determines junction temperatures in light-emitting diodes by measuring currents while holding the low forward voltages constant. In this procedure, we first calibrate current-temperature-rela- tionship parameters under the condition of negligible thermal generation. With one of the two parametric values, we discover the existence of a forward voltage peak that yields most sensitive measurements of the junction temperature. Results show a nearly linear relationship between the algorithmic currents and temperature reciprocals with high testing precision. more...
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- 2013
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11. Improved Quantum Efficiency in Semipolar $(1\bar{1}01)$ InGaN/GaN Quantum Wells Grown on GaN Prepared by Lateral Epitaxial Overgrowth
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Zhong Chen, Yulin Gao, Bao-Lin Liu, Yijun Lu, Zhe Chuan Feng, Lihong Zhu, Fanming Zeng, and Wei Liu
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Photoluminescence ,Materials science ,business.industry ,Wide-bandgap semiconductor ,Gallium nitride ,Epitaxy ,Electronic, Optical and Magnetic Materials ,law.invention ,chemistry.chemical_compound ,chemistry ,law ,Optoelectronics ,Quantum efficiency ,Metalorganic vapour phase epitaxy ,Electrical and Electronic Engineering ,business ,Quantum well ,Light-emitting diode - Abstract
We investigated the comparative structural and optical properties of semipolar InGaN/GaN multiple quantum wells (MQWs) grown on the (1101) facet GaN/sapphire substrate by metal-organic chemical vapor deposition using lateral epitaxial overgrowth. The scanning electron microscopy (SEM), photoluminescence (PL), and temperature-varying time-resolved photoluminescence measurement were performed to investigate the structure and optical properties. The cross-sectional SEM image shows that the stripe triangular structure of the QW with semipolar (1101) planes is obtained as sidewall facets with the mask stripes aligned along the GaN α-axis. The structural and optical advantages of semipolar orientations were confirmed by a modurate shift of the PL peak energy, higher internal quantum efficiency, and lower radiative recombination lifetime than the MQWs on (0001) GaN grown by conventional methods. The results were obtained because of the reduced polarization fields in semipolar InGaN/GaN MQWs comparing with that in polar (0001) MQWs. more...
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- 2013
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12. Junction-Temperature Determination in InGaN Light-Emitting Diodes Using Reverse Current Method
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Tien-Mo Shih, Lihong Zhu, Yulin Gao, Si-Qi Lin, Chen Guolong, Zhong Chen, Biqing Wu, and Yijun Lu
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Materials science ,business.industry ,Wide-bandgap semiconductor ,Reverse current ,Forward voltage ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,law.invention ,Optics ,law ,Optoelectronics ,Junction temperature ,Electrical and Electronic Engineering ,business ,Diode ,Light-emitting diode - Abstract
A method is presented in this study to determine the junction temperature (Tj) of LED in terms of the relationship between the diode reverse current (IR) and Tj . A theoretical model for the dependence of IR on Tj is derived on the basis of the Shockley equation and is validated by our experimental results. The method is compared with the conventional forward voltage method, and its advantages have been identified. more...
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- 2013
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13. Transient Thermal Resistance Test of Single-Crystal-Silicon Solar Cell
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Jihong Zhang, Zhong Chen, Yijun Lu, Lihong Zhu, Chen Guolong, Ziquan Guo, and Yulin Gao
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Materials science ,Infrared ,business.industry ,Thermal resistance ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,law.invention ,Solar cell efficiency ,Optics ,law ,Solar cell ,Optoelectronics ,Junction temperature ,Solar simulator ,Electrical and Electronic Engineering ,business ,Light-emitting diode - Abstract
This paper reports the measurement of the junction temperature and the determination of the thermal resistance of the single-crystal-silicon solar cell under the dark and illuminating conditions, respectively. Under the dark condition, the solar cell is considered as a conventional p-n junction and is subject to a reverse current in order to measure its junction temperature and determine the thermal resistance. A white LED array is used as the light source to operate the solar cell in order to avoid the heating effect of the infrared light by the solar simulator. Furthermore, we thoroughly calculate the thermal dissipation power. The result demonstrates that the thermal resistance drops from 3.7 to 2.0 K/W with the increase of the irradiance from 89.6 to 194.3 $\hbox{W/m}^{2}$ . It is also found that the thermal resistance under the dark condition is much higher than that under the illuminating condition, which is attributed to the light effect on the thermal resistance. more...
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- 2012
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14. Studies of Scotopic/Photopic Ratios for Color-Tunable White Light-Emitting Diodes
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Yulin Gao, Chen Guolong, Si-Qi Lin, Jihong Zhang, Yijun Lu, Ziquan Guo, Tien-Mo Shih, Lihong Zhu, and Zhong Chen
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Materials science ,color rendering index ,light-emitting diodes ,Color temperature ,law.invention ,scotopic/photopic ratios ,Optics ,law ,Solid-state lighting ,Applied optics. Photonics ,Scotopic vision ,Electrical and Electronic Engineering ,Diode ,business.industry ,Wide-bandgap semiconductor ,QC350-467 ,Optics. Light ,luminous efficacy of radiation ,Atomic and Molecular Physics, and Optics ,TA1501-1820 ,Color rendering index ,Optoelectronics ,business ,Light-emitting diode ,Photopic vision - Abstract
Three- and four-hump InGaN-based white light-emitting diodes (LEDs) have been computationally investigated. The investigation includes three-hump LEDs precoated with green- and red-emitting quantum dots (QDs) and four-hump LEDs precoated with green-, yellow-, and red-emitting QDs. Results show scotopic/photopic (S/P) ratios $>$ 3.80 and color rendering indices (CRIs) $\geq$ 70 for three-hump LEDs and S/P ratios $>$ 3.90 and CRIs $\geq$ 70 for four-hump LEDs under a correlated color temperature (CCT) of 45 000 K. Furthermore, for both three- and four-hump LEDs under the condition of CCT $>$ 5000 K, optimal results in this paper exhibit capabilities of exceeding $\hbox{S/P} = 2.50$ and simultaneously satisfying the criterion of CRI $\geq$ 70. Our simulation procedure is conducted under variations of nine CCTs, several wavelengths, and peak heights. Optimized results of S/P ratios and CRIs are identified and retained through filtering off a great number of unqualified candidates. Finally, present findings may help improve the quality of eye visions pertaining to LED illumination and help reduce the electrical energy consumption related to LED usage. more...
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- 2013
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15. Optimization Studies of Two-Phosphor-Coated White Light-Emitting Diodes
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Tien-Mo Shih, Yue Lin, Ziquan Guo, Lihong Zhu, Zhong Chen, Chen Guolong, Jihong Zhang, Yulin Gao, and Yijun Lu
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lcsh:Applied optics. Photonics ,Materials science ,business.industry ,Wide-bandgap semiconductor ,lcsh:TA1501-1820 ,Phosphor ,luminous efficacy of radiation ,Atomic and Molecular Physics, and Optics ,law.invention ,Color rendering index ,Optics ,law ,Solid-state lighting ,lcsh:QC350-467 ,Optoelectronics ,light-emitting diodes (LEDs) ,Light emission ,Electrical and Electronic Engineering ,Chromaticity ,Colorimetry ,Luminous efficacy ,business ,color rendering index (CRI) ,lcsh:Optics. Light ,Light-emitting diode - Abstract
Three-hump InGaN-based white light-emitting diodes (LEDs) precoated with traditional yellow/green phosphors and red-emitting quantum dots (QDs), have been numerically investigated. Under variations of eight correlated color temperatures (CCTs), three wavelengths, two bandwidths, and two peak heights, optimal results of luminous efficacy radiation (LER) and color rendering index (CRI) are identified and retained through filtering off billions of unqualified candidates. These results include LER = 390 lm/W and CRI = 90 [chromaticity difference (Duv)Duv on LED spectral parameters affected by operating temperatures. Finally, we have discovered that higher instabilities may be induced for cool white LEDs (CCT = 6500 K) than for warm white LEDs (CCT = 3000 K) within the analysis of CCT versus spectral parameters. more...
- Published
- 2013
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16. Efficiency Droop Improvement in InGaN/GaN Light-Emitting Diodes by Graded-Composition Multiple Quantum Wells
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Yulin Gao, Wei Liu, Lihong Zhu, Bao-Lin Liu, Fanming Zeng, Zhong Chen, and Yijun Lu
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lcsh:Applied optics. Photonics ,Materials science ,business.industry ,InGaN/GaN multiple quantum well (MQW) ,Wide-bandgap semiconductor ,lcsh:TA1501-1820 ,Electroluminescence ,Atomic and Molecular Physics, and Optics ,Active layer ,law.invention ,efficiency droop ,law ,lcsh:QC350-467 ,Optoelectronics ,Metal–organic chemical vapor deposition (MOCVD) ,electron leakage ,Quantum efficiency ,Voltage droop ,Electrical and Electronic Engineering ,business ,Current density ,lcsh:Optics. Light ,Diode ,Light-emitting diode - Abstract
InGaN/GaN light-emitting diodes (LEDs) with a graded-composition multiple quantum well (GQW) were designed not only to investigate the effect of polarization field on the efficiency droop in InGaN/GaN multiple quantum wells (MQWs) but to find out possible solutions to prevent or reduce the efficiency droop in GaN-based LEDs as well. Pulsed electroluminescence measurement, to avoid heating effects partly, revealed that the output intensity peak occurs at ~280A/cm2 current density for the GQW structure, whereas for a conventional structure, it occurs at a much lower current density of ~150A/cm2. The relative quantum efficiency indicates that the efficiency droop in GQW LEDs was reduced effectively due to the reduction in polarization field in the active layer. In the test GQW structure with inverse indium composition variation direction, electrons escape from the active region, which is in company with rapid saturation of output power and decrease in efficiency observed at high current density. It indicates that at high current density, the electron leakage is obvious. These results suggest that the polarization field in the active layer and the consequent electron leakage are probably the main mechanism responsible for the efficiency droop at high current injection levels. more...
- Published
- 2013
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