1. Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices
- Author
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Charalabos A. Dimitriadis, Christoforos G. Theodorou, E. G. Ioannidis, Gerard Ghibaudo, Sebastien Haendler, Aristotle University of Thessaloniki, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES), European Project: 325633,EC:FP7:SP1-JTI,ENIAC-2012-2,PLACES2BE(2012), and Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)
- Subjects
010302 applied physics ,Computer science ,Infrasound ,020208 electrical & electronic engineering ,Monte Carlo method ,Statistical parameter ,02 engineering and technology ,01 natural sciences ,Noise (electronics) ,symbols.namesake ,CMOS ,Gaussian noise ,0103 physical sciences ,Log-normal distribution ,Dispersion (optics) ,0202 electrical engineering, electronic engineering, information engineering ,Electronic engineering ,symbols ,Statistical dispersion ,Statistical physics ,[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics ,Electrical and Electronic Engineering - Abstract
International audience; The impact on the extracted low-frequency noise (LFN) parameter values due to LFN variability in CMOS devices is investigated. First, it is demonstrated that the noise level dispersion follows a log normal statistical distribution. Then, based on this feature, it is explained why the mean values from the linear data are different from the mean values (or median values) calculated from the log noise data. Finally, the consequence of this finding in terms of LFN characterisation issues and Monte Carlo LFN variability circuit simulation is discussed.
- Published
- 2014