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2D materials offer a pathway for further scaling of CMOS technology. However, for this to become a reality, both n-MOS and p-MOS should be realized, ideally with the same (standard) material. In the specific case of MoS2 field effect transistors (FETs), ambipolar transport is seldom reported, primarily due to the phenomenon of Fermi level pinning (FLP). In this study we identify the possible sources of FLP in MoS2 FETs and resolve them individually. A novel contact transfer technique is used to transfer contacts on top of MoS2 flake devices that results in a significant increase in the hole branch of the transfer characteristics as compared to conventionally fabricated contacts. We hypothesize that the pinning not only comes from the contact-MoS2 interface, but also from the MoS2-substrate interface. We confirm this by shifting to an hBN substrate which leads to a 10 fold increase in the hole current compared to the SiO2 substrate. Furthermore, we analyse MoS2 FETs of different channel thickness on three different substrates, SiO2, hBN and Al2O3, by correlating the p-branch ION/IOFF to the position of oxide defect band in these substrates. FLP from the oxide is reduced in the case of Al2O3 which enables us to observe ambipolar transport in a bilayer MoS2 FET. These results highlight that MoS2 is indeed an ambipolar material, and the absence of ambipolar transport in MoS2 FETs is strongly correlated to its dielectric environment and processing conditions. [ABSTRACT FROM AUTHOR]

The article focuses on graphene transistors and photodetectors. It states that the graphene is a thin crystalline film that has unique electronic structure and strong electric field effect. It discusses the properties of single layer graphene based field effect transistor (FET). It also mentions the use and property of bilayer graphene (BLG) and features the operation principles of graphene photodetectors.

We investigate colloidal Fe3O4 nanocrystals as a catalyst system for carbon nanotube (CNT) growth that allows for decoupling the CNT growth step from the catalyst shaping and activation step. The system consists of 6.4 nm Fe3O4 nanocrystals synthesized using a solution-based thermal decomposition reaction and, subsequently, transferred as hexagonally ordered Langmuir–Blodgett (LB) monolayers on TiN substrates. We demonstrate for the first time aligned CNT growth from LB deposited nanocrystals on a metallic underlayer. The hexagonally ordered monolayers of catalyst particles show promising stability up to the CNT growth temperature. In situ TEM heating experiments were performed to find this onset of particle deformation and showed stability of the nanoparticles up to 600 °C. The particle coalescence at high temperatures was also evidenced by the increasing CNT diameter, from 9.5 nm at 580 °C to 16 nm at 630 °C. By choosing to work at temperatures below the onset particle coalescence temperature, equivalent CNT diameters were obtained under different catalyst activation and growth conditions. The high stability of the catalyst on the metallic underlayer enables us to study CNT growth kinetics independently of the catalyst shaping step. This work opens a route towards combining growth studies with an electrical evaluation of the CNT growth as the TiN can be used as the bottom contact. [ABSTRACT FROM AUTHOR]