1. A comparative study with CF4 and SiF4 molecules
- Author
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Ohtomi, S., Matsui, M., Mochizuki, Y., Suga, A., Kato, H., Hoshino, M., Duflot, D., Limão-Vieira, P., Tanaka, Hideaki, CeFITec – Centro de Física e Investigação Tecnológica, and DF – Departamento de Física
- Subjects
SPECTROSCOPY ,SCATTERING ,Physics and Astronomy(all) - Abstract
We report on the measurements of the electron impact electronic excitation cross sections for XF4 (X = C, Si and Ge) molecules at 100 eV, 5° scattering angle and 30 eV, 30° in the electron energy loss range 8.0 - 18 eV. For a target of GeF4 molecule, the optically-forbidden behavior has been observed in the lower electron energy loss range. publishersversion published
- Published
- 2015