6 results on '"Kaczer, Ben"'
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2. Seed Layer and Multistack Approaches to Reduce Leakage in SrTiO3-Based Metal–Insulator–Metal Capacitors Using TiN Bottom Electrode
3. Reliability of HfSiON gate dielectrics
4. Reliability: a possible showstopper for oxide thickness scaling?
5. Reliability of HfSiON gate dielectrics.
6. Temperature-accelerated breakdown in ultra-thin SiON dielectrics.
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