1. Orientation and layer thickness dependence on the longitudinal magnetization and transverse magnetization hysteresis loops of sputtered multilayer Fe/Si and Fe/Ge thin films
- Author
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R Zuberek, Mike R. J. Gibbs, Nicola A. Morley, and Krzysztof Fronc
- Subjects
Materials science ,Condensed matter physics ,Condensed Matter Physics ,Magnetic hysteresis ,Condensed Matter::Materials Science ,Magnetization ,Hysteresis ,symbols.namesake ,Magnetic anisotropy ,Remanence ,Condensed Matter::Superconductivity ,symbols ,General Materials Science ,Thin film ,Anisotropy ,Barkhausen effect - Abstract
The transverse magnetization and longitudinal magnetization hysteresis loops of sputtered thin films of Fe/Ge and Fe/Si multilayers on GaAs(001) substrates have been studied. The dependence of the film magnetic anisotropy on the bilayer period and semiconductor composition was investigated using a MOKE magnetometer. The hysteresis loops were measured as a function of the angle between the applied magnetic field and the hard–hard axis of the film. For the longitudinal magnetization, the Fe/Si film loops had lower remanent magnetization compared to the Fe/Ge film with the same spacer thickness. Thus the Fe/Si film had stronger exchange coupling across the spacer layer compared to the Fe/Ge film. For the thicker Ge spacer layer film, no exchange coupling was measured. For the transverse magnetization, the Fe/Ge multilayer films loops had only one Barkhausen jump. For the Fe/Si multilayer films loops, some contained one Barkhausen jump while others had two jumps, due to the cubic anisotropy contribution. These results are interpreted in terms of anisotropy and exchange energies.
- Published
- 2004
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